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Benefits of DfX in requirements engineering
Information and communications technology (ICT) companies have realised how
acknowledging the needs of both internal and external customers is a necessity for …
acknowledging the needs of both internal and external customers is a necessity for …
Automatic fault extraction and simulation of layout realistic faults for integrated analogue circuits
A comprehensive tool has been implemented for the comparison of different test preparation
techniques and target faults. It comprises of the realistic fault characterisation program LIFT …
techniques and target faults. It comprises of the realistic fault characterisation program LIFT …
Dynamic segment intersection search with applications
In this paper, we consider two restricted types of dynamic orthogonal segment intersection
search problems. One is the problem in which the underlying set is updated only by …
search problems. One is the problem in which the underlying set is updated only by …
Realistic faults map** scheme for the fault simulation of integrated analogue CMOS circuits
MJ Ohletz - … International Test Conference 1996. Test and …, 1996 - ieeexplore.ieee.org
A new fault modelling scheme for integrated analogue CMOS circuits referred to as Local
Layout Realistic Fault Map** is introduced. It is aimed at realistic fault assumptions prior to …
Layout Realistic Fault Map** is introduced. It is aimed at realistic fault assumptions prior to …
IC defects-based testability analysis
IC Defects-Based Testability Analysis | Proceedings of the IEEE International Test Conference
on Test: Faster, Better, Sooner skip to main content ACM Digital Library home ACM Association …
on Test: Faster, Better, Sooner skip to main content ACM Digital Library home ACM Association …
CMOS IC fault models, physical defect coverage, and I/sub DDQ/testing
RR Fritzemeier, CF Hawkins… - Proceedings of the IEEE …, 1991 - ieeexplore.ieee.org
The development of the stuck-at fault (SAF) model is reviewed with emphasis on its
relationship to CMOS integrated circuit (IC) technologies. The ability of the SAF model to …
relationship to CMOS integrated circuit (IC) technologies. The ability of the SAF model to …
Highly testable and compact single output comparator
In this paper a single output self-checking n-input comparator is presented. The proposed
circuit, which can be used as n-variable two-rail checker or as equality checker features a …
circuit, which can be used as n-variable two-rail checker or as equality checker features a …
On-line testing scheme for clock's faults
This paper proposes an on-line testing scheme for permanent and temporary faults which
affect signals of the clock distribution network of synchronous systems, and which make …
affect signals of the clock distribution network of synchronous systems, and which make …
[PDF][PDF] Physical DFT for High Coverage of Realistic Faults.
Test quality requires the ability of test patterns to cover realistic faults originated by physical
defects induced during IC manufacturing. Recent progress in a methodology for physical …
defects induced during IC manufacturing. Recent progress in a methodology for physical …
New efficient totally self-checking Berger code checkers
This paper presents a new method for designing totally self-checking (TSC) Berger code
checkers for any number k of information bits, even for k= 2r− 1, taking into account realistic …
checkers for any number k of information bits, even for k= 2r− 1, taking into account realistic …