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Surface preparation and deposited gate oxides for gallium nitride based metal oxide semiconductor devices
RD Long, PC McIntyre - Materials, 2012 - mdpi.com
The literature on polar Gallium Nitride (GaN) surfaces, surface treatments and gate
dielectrics relevant to metal oxide semiconductor devices is reviewed. The significance of …
dielectrics relevant to metal oxide semiconductor devices is reviewed. The significance of …
Structural and insulating behaviour of high-permittivity binary oxide thin films for silicon carbide and gallium nitride electronic devices
High-κ dielectrics are insulating materials with higher permittivity than silicon dioxide. These
materials have already found application in microelectronics, mainly as gate insulators or …
materials have already found application in microelectronics, mainly as gate insulators or …
Investigation of trap** effects in AlGaN/GaN/Si field-effect transistors by frequency dependent capacitance and conductance analysis
We report on frequency dependent capacitance and conductance analysis of the
AlGaN/GaN/Si heterostructure field-effect transistors (HFETs) and Al 2 O 3/AlGaN/GaN/Si …
AlGaN/GaN/Si heterostructure field-effect transistors (HFETs) and Al 2 O 3/AlGaN/GaN/Si …
GaN-based trench gate metal oxide semiconductor field effect transistors with over 100 cm2/(V s) channel mobility
H Otake, S Egami, H Ohta, Y Nanishi… - Japanese Journal of …, 2007 - iopscience.iop.org
Enhancement-mode metal oxide semiconductor field effect transistors (MOSFETs) with
trench gate structures have been developed. These MOSFETs show excellent DC …
trench gate structures have been developed. These MOSFETs show excellent DC …
Electrical characterization of Au/n-GaN metal–semiconductor and Au/SiO2/n-GaN metal–insulator–semiconductor structures
In the present work, we have investigated the current–voltage (I–V) and capacitance–
voltage (C–V) characteristics of Au/SiO 2/n-GaN metal–insulator–semiconductor (MIS) …
voltage (C–V) characteristics of Au/SiO 2/n-GaN metal–insulator–semiconductor (MIS) …
Interface properties of thermally oxidized n-GaN metal–oxide–semiconductor capacitors
Y Nakano, T Jimbo - Applied physics letters, 2003 - pubs.aip.org
We report on the interface properties of thermally oxidized n-GaN metal–oxide–
semiconductor capacitors fabricated on sapphire substrates. 100-nm-thick β-Ga 2 O 3 was …
semiconductor capacitors fabricated on sapphire substrates. 100-nm-thick β-Ga 2 O 3 was …
Formation, etching and electrical characterization of a thermally grown gallium oxide on the Ga-face of a bulk GaN substrate
Thermal oxides on the Ga-face of low defect density bulk gallium nitride (GaN) were
controllably produced under varying conditions and subsequently analyzed. The thermal …
controllably produced under varying conditions and subsequently analyzed. The thermal …
Recent development of gallium oxide thin film on GaN
HS Oon, KY Cheong - Materials science in semiconductor processing, 2013 - Elsevier
Gallium nitride (GaN) has attracted much attention due to its outstanding characteristics. It
may replace conventional semiconductor materials, such as silicon, that are approaching …
may replace conventional semiconductor materials, such as silicon, that are approaching …
Dielectric characterization of transparent epitaxial Ga2O3 thin film on n-GaN∕ Al2O3 prepared by pulsed laser deposition
SA Lee, JY Hwang, JP Kim, SY Jeong… - Applied physics letters, 2006 - pubs.aip.org
(2 01)-oriented β-Ga 2 O 3∕ Ga N thin films were epitaxially grown by pulsed laser
deposition. These films have the specific in-plane orientation, which was confirmed by φ …
deposition. These films have the specific in-plane orientation, which was confirmed by φ …
Advances and prospects in Ga2O3/GaN heterojunctions: From fabrication to high-performance devices
K Xu, R Wang, Y Wang, J Wang, T Zhi, G Yang… - Materials Science in …, 2025 - Elsevier
Abstract Gallium oxide (Ga 2 O 3) and gallium nitride (GaN) are fourth-and third-generation
semiconductor materials, respectively. Their heterogeneous structure (lattice mismatch of …
semiconductor materials, respectively. Their heterogeneous structure (lattice mismatch of …