Effects of Thermal Boundary Resistance on Thermal Management of Gallium-Nitride-Based Semiconductor Devices: A Review
Wide-bandgap gallium nitride (GaN)-based semiconductors offer significant advantages
over traditional Si-based semiconductors in terms of high-power and high-frequency …
over traditional Si-based semiconductors in terms of high-power and high-frequency …
Cryogenic CMOS for quantum processing: 5-nm FinFET-based SRAM arrays at 10 K
In this work, we are the first to investigate and model the characteristics of a commercial 5nm
FinFET technology from room temperature (300K) all the way down to cryogenic …
FinFET technology from room temperature (300K) all the way down to cryogenic …
FinFET to GAA MBCFET: A Review and Insights
This review article presents a journey from Fin-shaped field effect transistor (FinFET) to gate-
all-around multi-bridge channel field effect transistor (GAA MBCFET) technology, unraveling …
all-around multi-bridge channel field effect transistor (GAA MBCFET) technology, unraveling …
Transistor self-heating-aware synthesis for reliable digital circuit designs
With the continuous scaling in technology nodes, the transistor self-heating effect (SHE)
emerges as a growing threat to circuit reliability. Increasingly confined transistor structures …
emerges as a growing threat to circuit reliability. Increasingly confined transistor structures …
Upheaving self-heating effects from transistor to circuit level using conventional eda tool flows
In this work, we are the first to demonstrate how well-established EDA tool flows can be
employed to upheave Self-Heating Effects (SHE) from individual devices at the transistor …
employed to upheave Self-Heating Effects (SHE) from individual devices at the transistor …
Special session: Machine learning for semiconductor test and reliability
With technology scaling approaching atomic levels, IC test and diagnosis of complex System-
on-Chips (SoCs) become overwhelming challenging. In addition, sustaining the reliability of …
on-Chips (SoCs) become overwhelming challenging. In addition, sustaining the reliability of …
TREAFET: Temperature-Aware Real-Time Task Scheduling for FinFET based Multicores
The recent shift in the VLSI industry from conventional MOSFET to FinFET for designing
contemporary chip-multiprocessor (CMP) has noticeably improved hardware platforms' …
contemporary chip-multiprocessor (CMP) has noticeably improved hardware platforms' …
STIFF: thermally s afe t emperature effect i nversion aware F in F ET based multi-core
FinFET, a non-planar device, has become the prevalent choice for chip-multiprocessor
(CMP) designs due to its lower leakage and improved scalability as compared to planar …
(CMP) designs due to its lower leakage and improved scalability as compared to planar …
ML to the rescue: Reliability estimation from self-heating and aging in transistors all the way up processors
With increasingly confined 3D structures and newly-adopted materials of higher thermal
resistance, transistor self-heating has risen to a critical reliability threat in state-of-the-art and …
resistance, transistor self-heating has risen to a critical reliability threat in state-of-the-art and …
Impact of self-heating on performance, power and reliability in finfet technology
Self-heating is one of the biggest threats to reliability in current and advanced CMOS
technologies like FinFET and Nanowire, respectively. Encapsulating the channel with the …
technologies like FinFET and Nanowire, respectively. Encapsulating the channel with the …