Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
Special session: Autosoc-a suite of open-source automotive soc benchmarks
The current demands for autonomous driving generated momentum for an increase in
research in the different technologies required for these applications. Nonetheless, the …
research in the different technologies required for these applications. Nonetheless, the …
Arranging a Pool of Functional Test Sequences for Variable In-Field Test Periods
High workloads applied to a system cause chips to be more susceptible to aging effects that
may eventually result in hardware defects. The detection of the defects requires tests for …
may eventually result in hardware defects. The detection of the defects requires tests for …
In-Field Testing of Functionally-Possible Transition Faults With High Activation Frequencies
Motivated by the reliability requirements of chips in state-of-the-art technologies, this article
develops an approach to periodic in-field testing that has the following features. The faults …
develops an approach to periodic in-field testing that has the following features. The faults …
Functional Compaction for Functional Test Sequences
The occurrence of silent data corruption because of hardware defects in large scale data
centers points to the advantages of applying functional test sequences to detect hardware …
centers points to the advantages of applying functional test sequences to detect hardware …
An efficient strategy for the development of software test libraries for an automotive microcontroller family
With the introduction of the ISO26262 standard in the automotive field, numerous solutions
for the in-field and on-line testing have been proposed. Among the several test solutions …
for the in-field and on-line testing have been proposed. Among the several test solutions …
Direct Search Procedure for Functional Compaction With Improved Fault Coverage
An important component of ensuring system reliability is the application of functional tests.
Functional test sequences are available after simulation-based design verification, they can …
Functional test sequences are available after simulation-based design verification, they can …
Functional Design-for-Testability for Functional Test Sequences
Two properties of functional test sequences make them suitable for complementing scan-
based tests: they can detect defects whose activation requires large numbers of functional …
based tests: they can detect defects whose activation requires large numbers of functional …
A Fault Simulation Based Functional Safety Platform for Automotive Chips Complying with ISO26262
With the increasing scale of automotive electronics and the gradual maturity of the
automotive-grade chip development process, simulation-level fault injection has become the …
automotive-grade chip development process, simulation-level fault injection has become the …
[PDF][PDF] Self-Test Mechanisms for Automotive Multi-Processor System-on-Chips
A Floridia - 2021 - tesidottorato.depositolegale.it
While the technology for enabling fully autonomous self-driving cars is still ahead, today
automobiles massively rely on electronics for a variety of functionalities. As these …
automobiles massively rely on electronics for a variety of functionalities. As these …
[PDF][PDF] Reliability in Power Electronics and Power Systems
D Piumatti - 2021 - tesidottorato.depositolegale.it
The electronic devices used in modern analog and digital systems can be affected by faults.
For example, physical manufactury defects or device ageing are common causes of faults …
For example, physical manufactury defects or device ageing are common causes of faults …