6MV LINAC characterization of a MOSFET dosimeter fabricated in a CMOS process
M Garcia-Inza, M Cassani, S Carbonetto, M Casal… - Radiation …, 2018 - Elsevier
This paper presents the characterization of a thick gate oxide MOSFET for radiotherapy in-
vivo dosimetry. The device is an N-channel transistor fabricated in a standard CMOS …
vivo dosimetry. The device is an N-channel transistor fabricated in a standard CMOS …
Influence of Interface Traps on MOSFET thermal coefficients and its effects on the ZTC current
RG Cozzi, E Redín, M Garcia–Inza, LS Salomone… - Microelectronics …, 2022 - Elsevier
Interface degradation-induced shifts of MOSFET thermal coefficients and zero temperature
coefficient current (IZTC) were studied by monitoring the interface traps (N it) growth in a …
coefficient current (IZTC) were studied by monitoring the interface traps (N it) growth in a …
MOS devices and integrated circuits for ionizing radiation dosimetry: A review
M Garcia-Inza, S Carbonetto… - … Argentine Conference on …, 2020 - ieeexplore.ieee.org
In this paper we review the main aspects of MOS dosimetry. MOS dosimeters have been
used for the last 50 years, and its performance has improved since then. To understand how …
used for the last 50 years, and its performance has improved since then. To understand how …
Total Ionizing Dose Effects on Floating Gate Structures-Preliminary Results
S Carbonetto, L Genovese… - 2021 IEEE 22nd …, 2021 - ieeexplore.ieee.org
The design and characterization of an ionizing radiation sensor for radiotherapy applications
based on floating gate structures are presented. The devices were fabricated in a …
based on floating gate structures are presented. The devices were fabricated in a …
Design and characterization of a CMOS two-stage miller amplifier for ionizing radiation dosimetry
G Salaya, M Garcia-Inza, S Carbonetto… - … Conference of Micro …, 2017 - ieeexplore.ieee.org
The offset of a Miller amplifier is mainly due to an imperfect matching between its inputs.
When the input transistors are MOSFETs, the exposure to ionizing radiation affect the …
When the input transistors are MOSFETs, the exposure to ionizing radiation affect the …
Ultralow Power Ionizing Dose Sensor Based on Complementary Fully Depleted MOS Transistors for Radiotherapy Application
We evaluate the use of thick buried oxide (BOX) of fully depleted silicon-on-insulator (FD-
SOI) transistors for total ionizing dose (TID) measurements in a radiotherapy application …
SOI) transistors for total ionizing dose (TID) measurements in a radiotherapy application …
A Study of Pulsed-Charging Methods for Floating Gate MOSFETs Designed for Radiation Measurements
L Nimo, MV Cassani, LS Salomone… - … on Electronics (CAE …, 2024 - ieeexplore.ieee.org
In this paper, two pulse-based injection methods are employed for charging/discharging a
floating gate transistor, specially designed to work as dosimeter in radiotherapy applications …
floating gate transistor, specially designed to work as dosimeter in radiotherapy applications …
A physics-based numerical modeling of total ionizing dose effects in CMOS integrated circuits
MV Cassani, LS Salomone… - … on Electronics (CAE …, 2023 - ieeexplore.ieee.org
A physics-based numerical model is proposed as a simulation tool to predict the total
ionizing dose response of CMOS integrated circuits. The model includes the radiation …
ionizing dose response of CMOS integrated circuits. The model includes the radiation …
Injection Mesurements and Simulation for a Floating Gate MOSFET Designed for Radiation Measurements
S Carbonetto, JCS Martene… - … on Electronics (CAE …, 2019 - ieeexplore.ieee.org
In this paper, a Floating Gate transistor designed and fabricated to be used as a radiation
sensor is presented, and the charge injection process through an injection electrode is …
sensor is presented, and the charge injection process through an injection electrode is …
A Total Ionizing Dose Detecting Circuit Based on Off-state Leakage Current of NLDMOS in Power IC
P Luo, R Ling, X Zhou, P Jiang… - 2019 31st International …, 2019 - ieeexplore.ieee.org
Due to the demand of aerospace applications, radiation-hard techniques have become
critical for power IC. In order to compensate the total ionizing dose (TID) effect on the circuits …
critical for power IC. In order to compensate the total ionizing dose (TID) effect on the circuits …