A benchmarking of silane, disilane and dichlorosilane for the low temperature growth of group IV layers

JM Hartmann, V Benevent, JF Damlencourt, T Billon - Thin Solid Films, 2012 - Elsevier
In a 300mm industrial Reduced Pressure–Chemical Vapour Deposition tool we have
assessed the advantages and drawbacks of disilane for the low temperature growth of Si …

[HTML][HTML] Chemistry and kinetics governing hydride/chloride chemical vapor deposition of epitaxial Ge1− xSnx

J Margetis, SQ Yu, B Li, J Tolle - … of Vacuum Science & Technology A, 2019 - pubs.aip.org
Recent breakthroughs in Ge 1− x Sn x and Si y Ge 1− x− y Sn x materials and devices have
created much excitement within the photonics research community. Group IV …

Low-temperature, low-pressure chemical vapor deposition and solid phase crystallization of silicon–germanium films

M Tada, JH Park, JR Jain… - Journal of the …, 2008 - iopscience.iop.org
Low-pressure chemical vapor deposition of silicon–germanium and its SPC below are
investigated. The effects of precursor ratio [], pressure, and temperature are examined with …

Luminescent nanostructures based on Ge nanoparticles embedded in an oxide matrix

MI Ortiz, A Rodriguez, J Sangrador, T Rodriguez… - …, 2005 - iopscience.iop.org
Ge nanoparticles embedded in an oxide matrix have been obtained by (a) steam thermal
oxidation at 650 C of polycrystalline SiGe layers and (b) deposition of discontinuous Ge …

Effect of rapid thermal annealing on crystallization and stress relaxation of SiGe nanoparticles deposited by ICP PECVD

F Ravaux, NS Rajput, J Abed, L George, M Tiner… - RSC …, 2017 - pubs.rsc.org
This work demonstrates the viability of direct fabrication utilizing a single (deposition/anneal)
process for polycrystalline silicon germanium sub-micro particles. The process combines …

Comparative study of the luminescence of structures with Ge nanocrystals formed by dry and wet oxidation of SiGe films

A Rodríguez, MI Ortiz, J Sangrador, T Rodríguez… - …, 2007 - iopscience.iop.org
The luminescence emission of structures containing Ge nanocrystals embedded in a
dielectric matrix obtained by dry and wet oxidation of polycrystalline SiGe layers has been …

Growth by LPCVD, crystallization and characterization of SiGe nanoparticles for nanoelectronic devices

MI Ortiz, J Sangrador, A Rodríguez… - … status solidi (a), 2006 - Wiley Online Library
Amorphous SiGe nanoparticles embedded in an oxide matrix, with controlled composition,
diameter of a few nm, located in the same plane and with an areal density above 1012 cm–2 …

Combined RBS and TEM characterization of nano-SiGe layers embedded in SiO2

A Kling, MI Ortiz, J Sangrador, A Rodríguez… - Nuclear Instruments and …, 2006 - Elsevier
Grazing incidence RBS has been tested as a technique to detect and characterize SiGe
nanoparticles embedded in a SiO2 matrix. Suitable structures were deposited by low …

Reversible crystallization of alloys under the combined effect of light and temperature

P Martin, A Torres, J Jiménez, A Rodrıguez… - Journal of applied …, 2004 - pubs.aip.org
A reversible ordered state induced by the combined action of above band-gap light and
temperature in a-Si 1− x Ge x layers with 0⩽ x< 0.38 is reported. The experimental …

Porous SiGe nanostructures formed by electrochemical etching of thin poly-SiGe films

T Del Cano, LF Sanz, P Martın, M Avella… - Journal of The …, 2004 - iopscience.iop.org
We have studied the effect of the current density (J) and etching time in the formation of
porous poly-SiGe (pp-SiGe) layers, with Ge fractions in the 0 to 0.55 range, by …