Silica-based optical fibers, fiber-based devices and optical fiber sensors are today
integrated in a variety of harsh environments associated with radiation constraints. Under …

Dielectric breakdown is a sudden and catastrophic increase in the conductivity of an
insulator caused by electrical stress. It is one of the major reliability issues in electronic …

Interest in resistance switching is currently growing apace. The promise of novel high‐
density, low‐power, high‐speed nonvolatile memory devices is appealing enough, but …

It is well-established that oxide defects adversely affect functionality and reliability of a wide
range of microelectronic devices. In semiconductor-insulator systems, insulator defects can …

Understanding the relation between the time-dependent resistance drift in the amorphous
state of phase-change materials and the localised states in the band gap of the glass is …

Silica nanoparticles (SNPs), one of the most widely researched materials in modern science,
are now commonly exploited in surface coatings, biomedicine, catalysis, and engineering of …

Despite extensive experimental and theoretical studies, the atomistic mechanisms
responsible for dielectric breakdown (BD) in amorphous (a)-SiO2 are still poorly understood …

40 years of research on low-frequency (LF) noise and random-telegraph noise (RTN) in
metallic and semiconducting nanowires (NWs) demonstrate the importance of defects and …

Triboelectrification mechanism is still not understood, despite centuries of investigations.
Here, we propose a model showing that mechanochemistry is key to elucidate …

Experiments as well as theoretical calculations indicate that point defects in the amorphous
SiO 2 layer of electronic devices as well as in optical fibers are responsible for numerous …