Electrical characterization of GaN Schottky barrier diode at cryogenic temperatures

J Chen, M Zhu, X Lu, X Zou - Applied Physics Letters, 2020 - pubs.aip.org
In this report, electrical characteristics of the Ni/GaN Schottky barrier diode grown on
sapphire have been investigated in the range of 20 K–300 K, using current–voltage …

Study on the density of trap states between CdZnTe and passivation layer based on MIS structure

X Song, X Liang, J Min, J Zhang, S Li, P Qiu… - Materials Science in …, 2022 - Elsevier
CdZnTe room temperature nuclear radiation detectors are widely used in the fields of
homeland security, medical imaging and astrophysics. In the Cd 1-x Zn x Te radiation …

Determination of current transport and trap states density in AlInGaN/GaN heterostructures

E Arslan, S Ural, Ş Altındal, E Özbay - Microelectronics Reliability, 2019 - Elsevier
The energy distribution and the relaxation time constant of the trap states with respect to
conduction bands in the (Ni/Au) Schottky contact on AlInGaN/GaN heterostructures were …

High performance of Ag/AlN/Si Schottky diode: Study of the DC sputtering power effect on its electrical properties

S Ktifa, A Khalfaoui, M Rahmani, K Aouadi - Materials Science and …, 2024 - Elsevier
The DC sputtering power (DC SP) effect on the chemical composition, structural and
electrical properties of Ag/AlN/Si Schottky diode was studied. The AlN films grown on Si …

Study on improving the space charge behavior in insulating paper by depositing nanostructured alumina on its surface via magnetron sputtering

Y Mo, Y Yuan, R Liao - Thin Solid Films, 2020 - Elsevier
A nanostructured alumina (AlOx) layer was coated on an insulating paper surface to improve
space charge behavior by suppressing space charge injection from electrodes. Samples …

Temperature dependence of interface state density distribution determined from conductance–frequency measurements in Ni/n-GaP/Al diode

S Duman, K Ejderha, I Orak, N Yıldırım… - Journal of Materials …, 2020 - Springer
The conductance measurements of the non-annealed (D1) and 400° C annealed (D2) Ni/n-
GaP/Al diodes were made over a wide frequency range of (10 kHz to 5 MHz) and …

On the energy distribution of interface states and their relaxation time profiles in Al/pentacene/p-GaAs heterojunction diode

Y Şafak, M Soylu, F Yakuphanoğlu… - Journal of Applied …, 2012 - pubs.aip.org
The energy density distribution profile of the interface states (N ss) and their relaxation time
(τ) of Al/pentacene/p-GaAs heterojunction diodes were obtained from the admittance …

[HTML][HTML] Effect of AlN growth temperature on trap densities of in-situ metal-organic chemical vapor deposition grown AlN/AlGaN/GaN metal-insulator-semiconductor …

JJ Freedsman, T Kubo, T Egawa - AIP advances, 2012 - pubs.aip.org
The trap** properties of in-situ metal-organic chemical vapor deposition (MOCVD) grown
AlN/AlGaN/GaN metal-insulator-semiconductor heterostructure field-effect transistors (MIS …

Preparation and electrical characterization of Au/n-Si (1 1 0) structure with PVA–nickel acetate composite film interfacial layer

T Tunç, M Gökçen - Journal of composite materials, 2012 - journals.sagepub.com
Two types of Schottky diodes, with and without PVA (Ni-doped) layer, were fabricated to
investigate whether or not the PVA (Ni-doped) layer is effective on some electrical …

Current transport and formation of energy structures in narrow Au/n-GaAs Schottky diodes

RK Mamedov, MA Yeganeh - Microelectronics Reliability, 2012 - Elsevier
The current transport and formations of potential barrier height in narrow Au/n-GaAs
Schottky diodes (SD) with a contact surface in length of 200μm, width of 1 and 4μm have …