Machine learning in scanning transmission electron microscopy

SV Kalinin, C Ophus, PM Voyles, R Erni… - Nature Reviews …, 2022 - nature.com
Scanning transmission electron microscopy (STEM) has emerged as a uniquely powerful
tool for structural and functional imaging of materials on the atomic level. Driven by …

Electron microscopy studies of soft nanomaterials

Z Lyu, L Yao, W Chen, FC Kalutantirige… - Chemical …, 2023 - ACS Publications
This review highlights recent efforts on applying electron microscopy (EM) to soft (including
biological) nanomaterials. We will show how developments of both the hardware and …

Electron ptychography achieves atomic-resolution limits set by lattice vibrations

Z Chen, Y Jiang, YT Shao, ME Holtz, M Odstrčil… - Science, 2021 - science.org
Transmission electron microscopes use electrons with wavelengths of a few picometers,
potentially capable of imaging individual atoms in solids at a resolution ultimately set by the …

Four-dimensional scanning transmission electron microscopy (4D-STEM): From scanning nanodiffraction to ptychography and beyond

C Ophus - Microscopy and Microanalysis, 2019 - cambridge.org
Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

Electron ptychography of 2D materials to deep sub-ångström resolution

Y Jiang, Z Chen, Y Han, P Deb, H Gao, S **e, P Purohit… - Nature, 2018 - nature.com
Aberration-corrected optics have made electron microscopy at atomic resolution a
widespread and often essential tool for characterizing nanoscale structures. Image …

Radiation damage to organic and inorganic specimens in the TEM

RF Egerton - Micron, 2019 - Elsevier
Symptoms of radiation damage are reviewed, followed by a brief description of the three
main damage mechanisms: knock-on displacement (predominant in electrically conducting …

Towards oxide electronics: a roadmap

M Coll, J Fontcuberta, M Althammer, M Bibes… - Applied surface …, 2019 - orbit.dtu.dk
At the end of a rush lasting over half a century, in which CMOS technology has been
experiencing a constant and breathtaking increase of device speed and density, Moore's …

Direct imaging of local atomic structures in zeolite using optimum bright-field scanning transmission electron microscopy

K Ooe, T Seki, K Yoshida, Y Kohno, Y Ikuhara… - Science …, 2023 - science.org
Zeolites are used in industries as catalysts, ion exchangers, and molecular sieves because
of their unique porous atomic structures. However, direct observation of zeolitic local atomic …

High dynamic range pixel array detector for scanning transmission electron microscopy

MW Tate, P Purohit, D Chamberlain… - Microscopy and …, 2016 - academic.oup.com
We describe a hybrid pixel array detector (electron microscope pixel array detector, or
EMPAD) adapted for use in electron microscope applications, especially as a universal …

Imaging beam‐sensitive materials by electron microscopy

Q Chen, C Dwyer, G Sheng, C Zhu, X Li… - Advanced …, 2020 - Wiley Online Library
Electron microscopy allows the extraction of multidimensional spatiotemporally correlated
structural information of diverse materials down to atomic resolution, which is essential for …