Machine learning in scanning transmission electron microscopy
Scanning transmission electron microscopy (STEM) has emerged as a uniquely powerful
tool for structural and functional imaging of materials on the atomic level. Driven by …
tool for structural and functional imaging of materials on the atomic level. Driven by …
Electron microscopy studies of soft nanomaterials
This review highlights recent efforts on applying electron microscopy (EM) to soft (including
biological) nanomaterials. We will show how developments of both the hardware and …
biological) nanomaterials. We will show how developments of both the hardware and …
Electron ptychography achieves atomic-resolution limits set by lattice vibrations
Transmission electron microscopes use electrons with wavelengths of a few picometers,
potentially capable of imaging individual atoms in solids at a resolution ultimately set by the …
potentially capable of imaging individual atoms in solids at a resolution ultimately set by the …
Four-dimensional scanning transmission electron microscopy (4D-STEM): From scanning nanodiffraction to ptychography and beyond
C Ophus - Microscopy and Microanalysis, 2019 - cambridge.org
Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …
and spectroscopy of materials down to atomic resolution. Recent advances in detector …
Electron ptychography of 2D materials to deep sub-ångström resolution
Aberration-corrected optics have made electron microscopy at atomic resolution a
widespread and often essential tool for characterizing nanoscale structures. Image …
widespread and often essential tool for characterizing nanoscale structures. Image …
Radiation damage to organic and inorganic specimens in the TEM
RF Egerton - Micron, 2019 - Elsevier
Symptoms of radiation damage are reviewed, followed by a brief description of the three
main damage mechanisms: knock-on displacement (predominant in electrically conducting …
main damage mechanisms: knock-on displacement (predominant in electrically conducting …
Towards oxide electronics: a roadmap
At the end of a rush lasting over half a century, in which CMOS technology has been
experiencing a constant and breathtaking increase of device speed and density, Moore's …
experiencing a constant and breathtaking increase of device speed and density, Moore's …
Direct imaging of local atomic structures in zeolite using optimum bright-field scanning transmission electron microscopy
Zeolites are used in industries as catalysts, ion exchangers, and molecular sieves because
of their unique porous atomic structures. However, direct observation of zeolitic local atomic …
of their unique porous atomic structures. However, direct observation of zeolitic local atomic …
High dynamic range pixel array detector for scanning transmission electron microscopy
MW Tate, P Purohit, D Chamberlain… - Microscopy and …, 2016 - academic.oup.com
We describe a hybrid pixel array detector (electron microscope pixel array detector, or
EMPAD) adapted for use in electron microscope applications, especially as a universal …
EMPAD) adapted for use in electron microscope applications, especially as a universal …
Imaging beam‐sensitive materials by electron microscopy
Electron microscopy allows the extraction of multidimensional spatiotemporally correlated
structural information of diverse materials down to atomic resolution, which is essential for …
structural information of diverse materials down to atomic resolution, which is essential for …