[КНИГА][B] The RF and microwave handbook

M Golio - 2000 - taylorfrancis.com
The recent shift in focus from defense and government work to commercial wireless efforts
has caused the job of the typical microwave engineer to change dramatically. The modern …

A statistical study of de-embedding applied to eye diagram analysis

PD Hale, J Jargon, CMJ Wang… - IEEE Transactions …, 2011 - ieeexplore.ieee.org
We describe a stable method for calibrating digital waveforms and eye diagrams by use of
the measurement system response function and its regularized inverse. The function …

Large-signal network analysis

J Verspecht - IEEE Microwave Magazine, 2005 - ieeexplore.ieee.org
According to Mike McKinley of Georgia Tech, it's" the holy grail of microwave instrumentation
and measurements," it's" a new measurement science" according to Don DeGroot of …

Calibrated measurement of optoelectronic frequency response

PD Hale, DF Williams - IEEE transactions on microwave theory …, 2003 - ieeexplore.ieee.org
Calibrated measurement of optoelectronic frequency response Page 1 1422 IEEE
TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. 51, NO. 4, APRIL 2003 …

Calibration of sampling oscilloscopes with high-speed photodiodes

TS Clement, PD Hale, DF Williams… - … on microwave theory …, 2006 - ieeexplore.ieee.org
We calibrate the magnitude and phase response of equivalent-time sampling oscilloscopes
to 110 GHz. We use a photodiode that has been calibrated with our electrooptic sampling …

NVNA versus LSNA: enemies or friends?

W Van Moer, L Gomme - IEEE Microwave Magazine, 2010 - ieeexplore.ieee.org
The NVNA and the LSNA are powerful instruments which allow to measure the full nonlinear
behavior of microwave devices. They are super-oscilloscopes which are able to measure …

Waveform metrology: signal measurements in a modulated world

PD Hale, DF Williams, A Dienstfrey - Metrologia, 2018 - iopscience.iop.org
We review the waveform metrology program developed over many years at the National
Institute of Standards and Technology. The goal of this program is to provide a measurement …

Covariance-based uncertainty analysis of the NIST electrooptic sampling system

DF Williams, A Lewandowski… - IEEE Transactions …, 2006 - ieeexplore.ieee.org
We develop a covariance matrix describing the uncertainty of mismatch-corrected
measurements performed on the National Institute of Standards and Technology's …

The sampling oscilloscope as a microwave instrument

D Williams, P Hale, KA Remley - IEEE microwave magazine, 2007 - ieeexplore.ieee.org
Most of the equipment required is readily available in most microwave labs: a vector network
analyzer, a microwave signal generator, and, of course, a sampling oscilloscope. In this …

Traceable waveform calibration with a covariance-based uncertainty analysis

PD Hale, A Dienstfrey, JCM Wang… - IEEE Transactions …, 2009 - ieeexplore.ieee.org
We describe a method for calibrating the voltage that a step-like pulse generator produces at
a load at every time point in the measured waveform. The calibration includes an equivalent …