[КНИГА][B] The RF and microwave handbook
M Golio - 2000 - taylorfrancis.com
The recent shift in focus from defense and government work to commercial wireless efforts
has caused the job of the typical microwave engineer to change dramatically. The modern …
has caused the job of the typical microwave engineer to change dramatically. The modern …
A statistical study of de-embedding applied to eye diagram analysis
We describe a stable method for calibrating digital waveforms and eye diagrams by use of
the measurement system response function and its regularized inverse. The function …
the measurement system response function and its regularized inverse. The function …
Large-signal network analysis
J Verspecht - IEEE Microwave Magazine, 2005 - ieeexplore.ieee.org
According to Mike McKinley of Georgia Tech, it's" the holy grail of microwave instrumentation
and measurements," it's" a new measurement science" according to Don DeGroot of …
and measurements," it's" a new measurement science" according to Don DeGroot of …
Calibrated measurement of optoelectronic frequency response
Calibrated measurement of optoelectronic frequency response Page 1 1422 IEEE
TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. 51, NO. 4, APRIL 2003 …
TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOL. 51, NO. 4, APRIL 2003 …
Calibration of sampling oscilloscopes with high-speed photodiodes
We calibrate the magnitude and phase response of equivalent-time sampling oscilloscopes
to 110 GHz. We use a photodiode that has been calibrated with our electrooptic sampling …
to 110 GHz. We use a photodiode that has been calibrated with our electrooptic sampling …
NVNA versus LSNA: enemies or friends?
W Van Moer, L Gomme - IEEE Microwave Magazine, 2010 - ieeexplore.ieee.org
The NVNA and the LSNA are powerful instruments which allow to measure the full nonlinear
behavior of microwave devices. They are super-oscilloscopes which are able to measure …
behavior of microwave devices. They are super-oscilloscopes which are able to measure …
Waveform metrology: signal measurements in a modulated world
We review the waveform metrology program developed over many years at the National
Institute of Standards and Technology. The goal of this program is to provide a measurement …
Institute of Standards and Technology. The goal of this program is to provide a measurement …
Covariance-based uncertainty analysis of the NIST electrooptic sampling system
We develop a covariance matrix describing the uncertainty of mismatch-corrected
measurements performed on the National Institute of Standards and Technology's …
measurements performed on the National Institute of Standards and Technology's …
The sampling oscilloscope as a microwave instrument
Most of the equipment required is readily available in most microwave labs: a vector network
analyzer, a microwave signal generator, and, of course, a sampling oscilloscope. In this …
analyzer, a microwave signal generator, and, of course, a sampling oscilloscope. In this …
Traceable waveform calibration with a covariance-based uncertainty analysis
We describe a method for calibrating the voltage that a step-like pulse generator produces at
a load at every time point in the measured waveform. The calibration includes an equivalent …
a load at every time point in the measured waveform. The calibration includes an equivalent …