Validity and accuracy of resonance shift prediction formulas for microcantilevers: a review and comparative study

MA Mahmoud - Critical Reviews in Solid State and Materials …, 2016 - Taylor & Francis
This article provides a review of methods of predicting mass-induced resonance shifts in
microcantilevers. It combines a review of factors that influence resonance frequency shifts …

Characterization of Elastic Modulus Across the (Al1–xScx)N System Using DFT and Substrate-Effect-Corrected Nanoindentation

D Wu, Y Chen, S Manna, K Talley… - IEEE transactions on …, 2018 - ieeexplore.ieee.org
Knowledge of accurate values of elastic modulus of (Al 1-x Sc x) N is required for design of
piezoelectric resonators and related devices. Thin films of (Al 1-x Sc x) N across the entire …

Modeling and Prediction Method for Young's Moduli of Ti Alloys Based on Residual Muti-layer Perceptron

H Yan, Q Li, B Yang, Y Yang, Y Wang, H Zhang - JOM, 2024 - Springer
Accurate Young's modulus models of β-type Ti alloys can provide a convenient approach to
develo** Ti alloy, especially non-toxic and biocompatible medical materials. Data-driven …

Modeling and characterization of piezoelectric beams based on an aluminum nitride thin‐film layer

E Herth, E Algre, JY Rauch, JC Gerbedoen… - … status solidi (a), 2016 - Wiley Online Library
This paper presents a method to determine the mechanical properties of piezoelectric thin
films. The vibrational behavior of microcantilevers and clamped–clamped beams actuated …

Bendable III-N visible light-emitting diodes beyond mechanical flexibility: theoretical study on quantum efficiency improvement and color tunability by external strain

S Shervin, SH Kim, M Asadirad, SY Karpov… - Acs …, 2016 - ACS Publications
We show that bending of flexible light-emitting diodes based on polar group III–V nitride
structures can function as more than mechanically flexible devices through numerical …

Transfer of III-nitride epitaxial layers onto pre-patterned silicon substrates for the simple fabrication of free-standing MEMS

R Gujrati, A Kassem, C Ayela, F Mathieu, L Nicu… - Applied Physics …, 2024 - pubs.aip.org
In recent years, the remarkable properties and potential applications of III-nitride (III-N)
semiconductors have sparked a significant interest in the field of microelectromechanical …

Direct evidence of barrier inhomogeneities at metal/AlGaN/GaN interfaces using nanoscopic electrical characterizations

A Kumar, R Kapoor, M Garg, V Kumar… - Nanotechnology, 2017 - iopscience.iop.org
The existence of barrier inhomogeneities at metal–semiconductor interfaces is believed to
be one of the reasons for the non-ideal behaviour of Schottky contacts. In general, barrier …

Tailored fabrication of a self-rolled-up AlGaN/GaN tubular structure with photoelectrochemical etching

H Hwang, S Ahn, HG Song, KY Woo, YH Cho - Optics Letters, 2024 - opg.optica.org
Group III-nitride semiconductors with tubular structures offer significant potential across
various applications, including optics, electronics, and chemical sensors. However …

Insufficiency of the Young's modulus for illustrating the mechanical behavior of GaN nanowires

MRZ Kouhpanji, M Behzadirad, D Feezell… - …, 2018 - iopscience.iop.org
We use a non-classical modified couple stress theory including the acceleration gradients
(MCST-AG), to precisely demonstrate the size dependency of the mechanical properties of …

Fabrication of GaN cantilever on GaN substrate by photo-electrochemical etching

T Yamada, Y Ando, H Watanabe… - Applied Physics …, 2021 - iopscience.iop.org
Photo-electrochemical (PEC) etching is a promising technique for fabricating GaN
microelectromechanical systems devices. In this study, we demonstrate the fabrication of …