Strain engineering in power-generating and self-powered nanodevices

DB Kim, JY Kim, J Han, YS Cho - Nano Energy, 2024 - Elsevier
Strain engineering has been extensively studied as a practical approach for controlling the
electronic and optoelectronic properties of inorganic materials by deliberately imposing …

Stress and its effect on optical properties of GaN epilayers grown on Si(111), 6H-SiC(0001), and c-plane sapphire

DG Zhao, SJ Xu, MH **e, SY Tong, H Yang - Applied physics letters, 2003 - pubs.aip.org
The stress states in unintentionally doped GaN epilayers grown on Si (111), 6H-SiC (0001),
and c-plane sapphire, and their effects on optical properties of GaN films were investigated …

Multifield-resolved phonon spectrometrics: structured crystals and liquids

X Yang, C Peng, L Li, M Bo, Y Sun, Y Huang… - Progress in Solid State …, 2019 - Elsevier
Bond relaxation from one equilibrium to another under perturbation matters uniquely the
performance of a substance and thus it has enormous impact to materials science and …

[PDF][PDF] Substrates for epitaxy of gallium nitride: new materials and techniques

SA Kukushkin, AV Osipov, VN Bessolov… - Rev. Adv. Mater. Sci, 2008 - ipme.ru
Different techniques for epitaxial growth of gallium nitride and main properties of GaN layers
as well as devices made on the base of GaN-structures are described in the review. A new …

Defect and stress characterization of AlN films by Raman spectroscopy

V Lughi, DR Clarke - Applied physics letters, 2006 - pubs.aip.org
Raman spectroscopy was used to characterize the residual stress and defect density of AlN
thin films reactively sputtered on silicon (100). The authors studied the correlation between …

Synthesis and optical characterization of aluminum nitride nanobelts

Q Wu, Z Hu, X Wang, Y Chen, Y Lu - The Journal of Physical …, 2003 - ACS Publications
Aluminum nitride nanobelts with hexagonal structure were successfully synthesized by
evaporating aluminum powder in ammonia/nitrogen atmosphere at 1200° C. The as …

Raman scattering spectroscopy of residual stresses in epitaxial AlN films

S Yang, R Miyagawa, H Miyake… - Applied physics …, 2011 - iopscience.iop.org
High-crystalline-quality epitaxial films of wurtzite AlN were grown by metalorganic vapor
phase epitaxy (MOVPE) and hydride vapor phase epitaxy (HVPE). The lattice strain of the …

The growth and optical properties of large, high-quality AlN single crystals

M Strassburg, J Senawiratne, N Dietz… - Journal of applied …, 2004 - pubs.aip.org
The effect of impurities and defects on the optical properties of AlN was investigated. High-
quality AlN single crystals of more than 20 mm 2 size were examined. Different crucible …

Defect evolution in AlN templates on PVD-AlN/sapphire substrates by thermal annealing

J Ben, X Sun, Y Jia, K Jiang, Z Shi, H Liu, Y Wang… - …, 2018 - pubs.rsc.org
AlN is the key material to obtain high performance ultraviolet optoelectronic and
microelectronic devices. To obtain high quality AlN, a high temperature annealing method is …

Extended vapor–liquid–solid growth and field emission properties of aluminium nitride nanowires

Q Wu, Z Hu, X Wang, Y Lu, K Huo, S Deng… - Journal of Materials …, 2003 - pubs.rsc.org
Hexagonal AlN (h-AlN) nanowires with an average diameter of around 15 nm have been
prepared by an extended vapor–liquid–solid growth technique and characterized by X-ray …