Multi-site testing saves test time and tests cost by screening multiple chips at once. However,
it comes with its issues. As test engineers increase the number of sites on each tester to …

Fault tolerance is used in communication systems to ensure high reliability and rapid error
recovery. The effectiveness of most proactive fault-tolerant mechanism depends on whether …

The amount of data generated and collected across computing platforms every day is not
only enormous, but growing at an exponential rate. Advanced data analytics and machine …

Fault tolerance is used in communication systems to ensure high reliability and rapid error
recovery. The effectiveness of most proactive fault-tolerant mechanism depends on whether …

Power supply fluctuation can be potential threat to the correct operations of processors, in
the form of voltage emergency that happens when supply voltage drops below a certain …

The huge amount of test data of a modern chip produced during manufacturing test could be
mined for valuable information about the device under test (DUT), far more than the pass/fail …

Virtual Probe (VP), proposed for characterization of spatial variations and for test time
reduction, can effectively reconstruct the spatial pattern of a test item for an entire wafer …

The growing complexity of integrated circuits (ICs) brings expensive manufacturing test cost.
Adaptive testing becomes an important way to save test cost by predicting die quality to …

It is known that statistical analysis of test data can help screen potential test escapes without
additional physical measurements. Based on analysis of production test data, this paper …

Variations in test fallout during the testing of high-volume devices may arise from a variety of
sources. Some of these, such as process variations and design marginalities, correspond to …