[HTML][HTML] New challenges of miniaturization of electronic devices: Electromigration and thermomigration in lead-free solder joints

P Zhang, S Xue, J Wang - Materials & Design, 2020 - Elsevier
The continuous improvement of electronic device performances and the advancement of
packaging technology have brought greater challenges to the reliability of solder joints in …

Reliability issues of lead-free solder joints in electronic devices

N Jiang, L Zhang, ZQ Liu, L Sun, WM Long… - … and technology of …, 2019 - Taylor & Francis
Electronic products are evolving towards miniaturization, high integration, and multi-function,
which undoubtedly puts forward higher requirements for the reliability of solder joints in …

Equilibrium phase diagram design and structural optimization of SAC/Sn-Pb composite structure solder joint for preferable stress distribution

S Xu, X **g, P Zhu, H **, KW Paik, P He… - Materials …, 2023 - Elsevier
Abstract The Package-on-Package (PoP) technology is an efficient knowhow to increase the
efficiency of electronic components, hence to secure the continuation of the validity of …

Electromigration in three-dimensional integrated circuits

Z Shen, S **g, Y Heng, Y Yao, KN Tu… - Applied Physics Reviews, 2023 - pubs.aip.org
The development of big data and artificial intelligence technology is increasing the need for
electronic devices to become smaller, cheaper, and more energy efficient, while also having …

Microstructure evolution and grain orientation of IMC in Cu-Sn TLP bonding solder joints

L Sun, M Chen, L Zhang - Journal of Alloys and Compounds, 2019 - Elsevier
Abstract In this work, Cu/Sn/Cu solder joints were fabricated by low temperature transient
liquid phase (TLP) bonding. The microstructure evolution and grain orientation of …

Recent progress in SLID bonding in novel 3D-IC technologies

L Sun, M Chen, L Zhang, P He, L **e - Journal of Alloys and Compounds, 2020 - Elsevier
Solid-liquid interdiffusion (SLID) bonding was extensively investigated as a potential
bonding method applied to 3D chip stacking because it can be bonded at a low temperature …

Inhibition of intermetallic compounds growth at Sn–58Bi/Cu interface bearing CuZnAl memory particles (2–6 μm)

L Zhang, Z Liu - Journal of Materials Science: Materials in Electronics, 2020 - Springer
Abstract In total, 0.5 wt% CuZnAl memory particles with the diameters (2–6 μm) were added
into Sn–58Bi solder in order to enhance the properties of solder joints in electronic …

Polymer‐based nanocomposites in semiconductor packaging

T Li, P Li, R Sun, S Yu - IET Nanodielectrics, 2023 - Wiley Online Library
Semiconductor packaging materials play a critical role in the development of semiconductor
devices. They not only provide reliable protection and support, but also contribute to the …

Characterization of Cu-Cu direct bonding in ambient atmosphere enabled using (111)-oriented nanotwinned-copper

M Zhang, LY Gao, JJ Li, R Sun, ZQ Liu - Materials Chemistry and Physics, 2023 - Elsevier
Abstract The copper-copper (Cu-Cu) direct bonding technology was proposed in recent
years in order to realize precise preparation and reliable service under high current density …

Low temperature Cu/SiO2 hybrid bonding via< 1 1 1>-oriented nanotwinned Cu with Ar plasma surface modification

MH Yu, JJ Ong, DP Tran, WL Chiu, WY Hsu… - Applied surface …, 2023 - Elsevier
Argon (Ar) plasma surface modification and highly (1 1 1)-oriented nanotwinned copper (nt-
Cu) were combined to lower the bonding temperature of Cu/SiO 2 hybrid joints. The contact …