Defect-impurity engineering in implanted silicon

AR Chelyadinskii, FF Komarov - Physics-Uspekhi, 2003 - iopscience.iop.org
The basic results of the studies of defect–impurity interaction in implanted silicon are
presented. Factors affecting the way in which quasichemical reactions proceed—namely …

Extended defects in diamond: The interstitial platelet

JP Goss, BJ Coomer, R Jones, CJ Fall, PR Briddon… - Physical review B, 2003 - APS
The structure and properties of the {001} planar platelet in diamond are investigated using
ab initio theory. We find that a carbonaceous model, based on a layer of self-interstitials …

[PDF][PDF] Дефектно-примесная инженерия в имплантированном кремнии

АР Челядинский, ФФ Комаров - Успехи физических наук, 2003 - bsu.by
Ионная имплантация является в настоящее время основным методом создания
легированных слоев полупроводников. Она обладает рядом неоспоримых …

[HTML][HTML] Investigation of point and extended defects in electron irradiated silicon—Dependence on the particle energy

R Radu, I Pintilie, LC Nistor, E Fretwurst… - Journal of Applied …, 2015 - pubs.aip.org
This work is focusing on generation, time evolution, and impact on the electrical
performance of silicon diodes impaired by radiation induced active defects. n-type silicon …

On the structure and photoluminescence of dislocations in silicon

LI Fedina, AK Gutakovskii, TS Shamirzaev - Journal of Applied Physics, 2018 - pubs.aip.org
This paper presents a comparative analysis of the structure and photoluminescence (PL) of
Si containing dislocations introduced by thermal shock or ion implantation. To study the …

Influence of constant magnetic fields on defect formation under conditions of heat shock in surface layers of silicon

AA Skvortsov, DE Pshonkin… - Key Engineering …, 2018 - Trans Tech Publ
The work is devoted to the study of defect formation processes in the near-surface layers of
silicon under thermal shock conditions and to the effect of preliminary exposure in a constant …

Detailed microscopic analysis of self-interstitial aggregation in silicon. I. Direct molecular dynamics simulations of aggregation

SS Kapur, T Sinno - Physical Review B—Condensed Matter and Materials …, 2010 - APS
A comprehensive atomistic study of self-interstitial aggregation in crystalline silicon is
presented. Here, large-scale parallel molecular dynamics simulations are used to generate …

In situ HREM irradiation study of point-defect clustering in MBE-grown strained structures

L Fedina, OI Lebedev, G Van Tendeloo, J Van Landuyt… - Physical Review B, 2000 - APS
We present a detailed analysis of the point-defect clustering in strained S i/S i 1− x Ge
x/(001) Si structures, including the interaction of the point defects with the strained interfaces …

Photoluminescence associated with {113} defects in oxygen‐implanted silicon

NA Sobolev, AE Kalyadin, EI Shek… - … status solidi (a), 2017 - Wiley Online Library
The dependences of photoluminescence (PL) and the structure of {113} defects induced in n‐
Cz‐Si (100) wafers by implantation of 350 keV O+ ions at a dose of 3.7× 1014 cm− 2 on the …

Diffusion model of the formation of growth microdefects: A new approach to defect formation in crystals

VI Talanin, IE Talanin - Physics of the Solid State, 2016 - Springer
Theoretical studies of defect formation in semiconductor silicon play an important role in the
creation of breakthrough ideas for next-generation technologies. A brief comparative …