An extended photoelectrothermal theory for LED systems: A tutorial from device characteristic to system design for general lighting
SYR Hui, H Chen, X Tao - IEEE Transactions on Power …, 2012 - ieeexplore.ieee.org
LED technology is a multidisciplinary subject that involves semiconductor physics,
photometry, electric power, heat, and chromaticity. It has been demonstrated that operating …
photometry, electric power, heat, and chromaticity. It has been demonstrated that operating …
Online condition monitoring methodology for power electronics package reliability assessment
This article introduces an online condition monitoring strategy that utilizes a transient heat
pulse to detect package thermal performance degradation. The metric employed is the …
pulse to detect package thermal performance degradation. The metric employed is the …
Thermal parameter monitoring of IGBT module using case temperature
J Zhang, X Du, Y Wu, Q Luo, P Sun… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
In this paper, we propose to monitor the thermal parameters of insulated gate bipolar
transistor (IGBT) module using the case temperature. This method works during the shutoff …
transistor (IGBT) module using the case temperature. This method works during the shutoff …
Thermographic network identification for transient thermal heat path analysis
NJ Ziegeler, PW Nolte, S Schweizer - Quantitative InfraRed …, 2023 - Taylor & Francis
In this work, an evaluation method for transient thermal measurements is presented. It allows
for a high temporal sensitivity by analysing the spectral composition of a thermal transient …
for a high temporal sensitivity by analysing the spectral composition of a thermal transient …
[PDF][PDF] IGBT 模块寿命评估研究综述
张军, 张犁, 成瑜 - TRANSACTIONS OF CHINA …, 2021 - dgjsxb.ces-transaction.com
摘要绝缘栅双极型晶体管(IGBT) 是电力电子系统实现电能变换与控制的核心组件之一. 然而,
工业界反馈的数据表明, 应用于高可靠性场合的IGBT 模块可靠性并不高, 其热疲劳失效将会导致 …
工业界反馈的数据表明, 应用于高可靠性场合的IGBT 模块可靠性并不高, 其热疲劳失效将会导致 …
Thermal analysis of power LED employing dual interface method and water flow as a cooling system
P Anithambigai, K Dinash, D Mutharasu… - Thermochimica …, 2011 - Elsevier
Thermal transient measurement based on structure function evaluation was used to
measure the thermal resistance. The study signifies the importance of dual interface method …
measure the thermal resistance. The study signifies the importance of dual interface method …
The efficiency and reliability improvement by utilizing quartz airtight packaging of UVC LEDs
CC Lu, CP Wang, CY Liu… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
This paper investigates a novel packaging that can effectively improve the efficiency and
reliability of 280-nm deep ultraviolet (DUV) light-emitting diodes (LEDs). The experimental …
reliability of 280-nm deep ultraviolet (DUV) light-emitting diodes (LEDs). The experimental …
Accurate and efficient algorithm for computing structure functions from the spatial distribution of thermal properties in electronic devices
An accurate and efficient algorithm is presented, which allows deriving the structure function
of a discretized 3-D heat conduction problem. In this approach, the partial thermal …
of a discretized 3-D heat conduction problem. In this approach, the partial thermal …
Thermal testing of LEDs
G Farkas, A Poppe - Thermal Management for LED Applications, 2014 - Springer
In this chapter, after a generic discussion of thermal testing techniques used to characterize
packaged semiconductor devices; the latest practical test methods widespread in thermal …
packaged semiconductor devices; the latest practical test methods widespread in thermal …
Analysis of thermal characteristics and mechanism of degradation of flip-chip high power LEDs
CP Wang, TT Chen, HK Fu, TL Chang, PT Chou… - Microelectronics …, 2012 - Elsevier
The purpose of this study is to investigate the thermal behavior at the die-attached interfaces
of flip-chip GaN high-power light emitting diodes (LEDs) using a combination of theoretical …
of flip-chip GaN high-power light emitting diodes (LEDs) using a combination of theoretical …