An extended photoelectrothermal theory for LED systems: A tutorial from device characteristic to system design for general lighting

SYR Hui, H Chen, X Tao - IEEE Transactions on Power …, 2012 - ieeexplore.ieee.org
LED technology is a multidisciplinary subject that involves semiconductor physics,
photometry, electric power, heat, and chromaticity. It has been demonstrated that operating …

Online condition monitoring methodology for power electronics package reliability assessment

HA Martin, ECP Smits, RH Poelma… - … on Power Electronics, 2024 - ieeexplore.ieee.org
This article introduces an online condition monitoring strategy that utilizes a transient heat
pulse to detect package thermal performance degradation. The metric employed is the …

Thermal parameter monitoring of IGBT module using case temperature

J Zhang, X Du, Y Wu, Q Luo, P Sun… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
In this paper, we propose to monitor the thermal parameters of insulated gate bipolar
transistor (IGBT) module using the case temperature. This method works during the shutoff …

Thermographic network identification for transient thermal heat path analysis

NJ Ziegeler, PW Nolte, S Schweizer - Quantitative InfraRed …, 2023 - Taylor & Francis
In this work, an evaluation method for transient thermal measurements is presented. It allows
for a high temporal sensitivity by analysing the spectral composition of a thermal transient …

[PDF][PDF] IGBT 模块寿命评估研究综述

张军, 张犁, 成瑜 - TRANSACTIONS OF CHINA …, 2021 - dgjsxb.ces-transaction.com
摘要绝缘栅双极型晶体管(IGBT) 是电力电子系统实现电能变换与控制的核心组件之一. 然而,
工业界反馈的数据表明, 应用于高可靠性场合的IGBT 模块可靠性并不高, 其热疲劳失效将会导致 …

Thermal analysis of power LED employing dual interface method and water flow as a cooling system

P Anithambigai, K Dinash, D Mutharasu… - Thermochimica …, 2011 - Elsevier
Thermal transient measurement based on structure function evaluation was used to
measure the thermal resistance. The study signifies the importance of dual interface method …

The efficiency and reliability improvement by utilizing quartz airtight packaging of UVC LEDs

CC Lu, CP Wang, CY Liu… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
This paper investigates a novel packaging that can effectively improve the efficiency and
reliability of 280-nm deep ultraviolet (DUV) light-emitting diodes (LEDs). The experimental …

Accurate and efficient algorithm for computing structure functions from the spatial distribution of thermal properties in electronic devices

L Codecasa, V D'Alessandro… - … on Electron Devices, 2021 - ieeexplore.ieee.org
An accurate and efficient algorithm is presented, which allows deriving the structure function
of a discretized 3-D heat conduction problem. In this approach, the partial thermal …

Thermal testing of LEDs

G Farkas, A Poppe - Thermal Management for LED Applications, 2014 - Springer
In this chapter, after a generic discussion of thermal testing techniques used to characterize
packaged semiconductor devices; the latest practical test methods widespread in thermal …

Analysis of thermal characteristics and mechanism of degradation of flip-chip high power LEDs

CP Wang, TT Chen, HK Fu, TL Chang, PT Chou… - Microelectronics …, 2012 - Elsevier
The purpose of this study is to investigate the thermal behavior at the die-attached interfaces
of flip-chip GaN high-power light emitting diodes (LEDs) using a combination of theoretical …