The impact of NBTI effect on combinational circuit: Modeling, simulation, and analysis
W Wang, S Yang, S Bhardwaj… - … Transactions on Very …, 2009 - ieeexplore.ieee.org
Negative-bias-temperature instability (NBTI) has become the primary limiting factor of circuit
life time. In this paper, we develop a hierarchical framework for analyzing the impact of NBTI …
life time. In this paper, we develop a hierarchical framework for analyzing the impact of NBTI …
Facelift: Hiding and slowing down aging in multicores
A Tiwari, J Torrellas - 2008 41st IEEE/ACM International …, 2008 - ieeexplore.ieee.org
Processors progressively age during their service life due to normal workload activity. Such
aging results in gradually slower circuits. Anticipating this fact, designers add timing …
aging results in gradually slower circuits. Anticipating this fact, designers add timing …
Multiple kernel tracking with SSD
Kernel-based objective functions optimized using the mean shift algorithm have been
demonstrated as an effective means of tracking in video sequences. The resulting …
demonstrated as an effective means of tracking in video sequences. The resulting …
Parameter variation tolerance and error resiliency: New design paradigm for the nanoscale era
Variations in process parameters affect the operation of integrated circuits (ICs) and pose a
significant threat to the continued scaling of transistor dimensions. Such parameter …
significant threat to the continued scaling of transistor dimensions. Such parameter …
Extratime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level
With shrinking feature sizes, transistor aging due to NBTI and HCI becomes a major
reliability challenge for microprocessors. These processes lead to increased gate delays …
reliability challenge for microprocessors. These processes lead to increased gate delays …
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-
induced process variation has significant impact on circuit performance and reliability …
induced process variation has significant impact on circuit performance and reliability …
On-chip reliability monitors for measuring circuit degradation
Front-end-of-line reliability issues such as Bias Temperature Instability (BTI), Hot Carrier
Injection (HCI), and Time Dependent Dielectric Breakdown (TDDB) have become more …
Injection (HCI), and Time Dependent Dielectric Breakdown (TDDB) have become more …
On the efficacy of NBTI mitigation techniques
Negative Bias Temperature Instability (NBTI) has become an important reliability issue in
modern semiconductor processes. Recent work has attempted to address NBTI-induced …
modern semiconductor processes. Recent work has attempted to address NBTI-induced …
Fine-grained aging-induced delay prediction based on the monitoring of run-time stress
Run-time solutions based on online monitoring and adaptation are required for resilience in
nanoscale integrated circuits, as design-time solutions and guard bands are no longer …
nanoscale integrated circuits, as design-time solutions and guard bands are no longer …
Integral impact of BTI, PVT variation, and workload on SRAM sense amplifier
The CMOS technology scaling faced over the past recent decades severe variability and
reliability challenges. One of the major reliability challenges is bias temperature instability …
reliability challenges. One of the major reliability challenges is bias temperature instability …