Memory‐switching effect in single crystals of thallium selenide

SA Hussein - Crystal Research and Technology, 1989 - Wiley Online Library
It has been found that thallium selenide single crystals exhibit bistable or memory switching.
The specimen under test showed threshold switching with critical field of the switching …

New unorthodox semiconductor devices

K Board - Reports on progress in physics, 1985 - iopscience.iop.org
A distinctive feature in the development of solid-state electronic devices has been the long
time interval that has usually elapsed between the initial conception of the device, and its …

Modified theory of MISS, MIST and OMIST devices

I Zolomy - Solid-State Electronics, 1983 - Elsevier
The theory of MISS, MIST and OMIST devices are modified in order to get better fit with
experimental data. Taking into account the generation current in the surface depletion layer …

Theory of the metal-insulator-semiconductor thyristor

SED Habib, JG Simmons - IEE Proceedings I (Solid-State and Electron Devices), 1980 - IET
The bistable behaviour displayed by the mi-n-p+ switch (designated miss: an acronym for
metal-insulator-silicon switch) can be electrically controlled via a third gate terminal. This …

Characteristics of metal/tunnel-oxide/n/p+ silicon switching devices—II: Two-dimensional effects in oxide-isolated structures

L Faraone, JG Simmons, FL Hsueh, UK Mishra - Solid-State Electronics, 1982 - Elsevier
Abstract Effects of oxide isolation on the two-terminal DC characteristics of metal/tunnel-
oxide/n/p+ silicon switching devices have been studied. Recent experimental results have …

Theory of switching in MISIM structures

M Darwish, K Board - IEE Proceedings I (Solid-State and Electron Devices), 1981 - IET
A detailed analysis of the DC switching characteristics of metal-thin insulator-semiconductor-
thin insulator-metal (MISIM) devices is presented. In contrast with conventional junction and …

Characteristics of metal/tunnel-oxide/N/P+ silicon switching devices—I: Effects of device geometry and fabrication processes

KA Duncan, PD Tonner, JG Simmons, L Faraone - Solid-State Electronics, 1981 - Elsevier
A systematic experimental study of metal/tunnel-oxide/N/P+(MISS) devices is presented.
Measurements on two-terminal devices suggest that the current-voltage characteristics are …

Optical performance of the silicon heterostructure switch

RJ Green, N Ali, AM Chol - IEEE transactions on electron …, 1989 - ieeexplore.ieee.org
The optical performance of a logical optical detector, that has been developed from a thin-
oxide MIS silicon switch, is considered in relation to its fabrication. The analysis accounts for …

Resonant tunnel switching in MISS devices

J Millan, F Serra-Mestres, X Aymerich-Humet - Solid-State Electronics, 1982 - Elsevier
The excess current experimentally observed in the Metal-Thin SiO 2 layer (n or p) Si (p+ or
n+)(MISS) structures cannot be explained by any of the existing models based on a direct …

Switching characteristics of MINPN devices

DCY Chang, CL Lee, TF Lei - Solid-state electronics, 1989 - Elsevier
The I–V characteristics of the MINPN devices have been studied with the focus on the
physical processes in the switchings. The study consists of computer simulation and …