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2013 Atomic spectrometry update—A review of advances in X-ray fluorescence spectrometry
M West, AT Ellis, PJ Potts, C Streli, C Vanhoof… - Journal of Analytical …, 2013 - pubs.rsc.org
This review comments on the ever expanding range of work using the XRF group of
techniques published approximately between April 2012 and March 2013. It presents …
techniques published approximately between April 2012 and March 2013. It presents …
An IAEA multi-technique X-ray spectrometry endstation at Elettra Sincrotrone Trieste: benchmarking results and interdisciplinary applications
AG Karydas, M Czyzycki, JJ Leani, A Migliori… - Synchrotron …, 2018 - journals.iucr.org
The International Atomic Energy Agency (IAEA) jointly with the Elettra Sincrotrone Trieste
(EST) operates a multipurpose X-ray spectrometry endstation at the X-ray Fluorescence …
(EST) operates a multipurpose X-ray spectrometry endstation at the X-ray Fluorescence …
The research progress of an E//B neutral particle analyzer
MA Long, QU Yufan, LUO Yuan… - Plasma Science and …, 2024 - iopscience.iop.org
An// neutral particle analyzer (NPA) has been designed and is under development at
Sichuan University and Southwestern Institute of Physics. The main purpose of the// NPA is …
Sichuan University and Southwestern Institute of Physics. The main purpose of the// NPA is …
Grazing-emission X-ray fluorescence as a multiprobe tool for thin-film metrology
Recent research has demonstrated the high potential of grazing-emission X-ray
fluorescence as a nanometrology tool for structures with complex 3D architecture. The …
fluorescence as a nanometrology tool for structures with complex 3D architecture. The …
[HTML][HTML] JGIXA—A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of …
D Ingerle, G Pepponi, F Meirer, P Wobrauschek… - … Acta Part B: Atomic …, 2016 - Elsevier
Grazing incidence XRF (GIXRF) is a very surface sensitive, nondestructive analytical tool
making use of the phenomenon of total external reflection of X-rays on smooth polished …
making use of the phenomenon of total external reflection of X-rays on smooth polished …
[KNJIGA][B] High-resolution XAS/XES: analyzing electronic structures of catalysts
J Sá - 2014 - books.google.com
Photon-in-photon-out core level spectroscopy is an emerging approach to characterize the
electronic structure of catalysts and enzymes, and it is either installed or planned for intense …
electronic structure of catalysts and enzymes, and it is either installed or planned for intense …
Controlling core-hole lifetime through an x-ray planar cavity
XC Huang, XJ Kong, TJ Li, ZR Ma, HC Wang… - Physical Review …, 2021 - APS
It has long been believed that the core-hole lifetime (CHL) of an atom is an intrinsic physical
property, and controlling it is significant yet is very hard. Here, the CHL of the 2 p state of a W …
property, and controlling it is significant yet is very hard. Here, the CHL of the 2 p state of a W …
An interactive graphical user interface (GUI) for the CATGIXRF program – for microstructural evaluation of thin film and impurity doped surfaces
This paper is a continuation and extension of our earlier work (X‐ray Spectrom. 2010, 39,
127–134, DOI: 10.1002/xrs. 1215) on the development of a software platform CATGIXRF, as …
127–134, DOI: 10.1002/xrs. 1215) on the development of a software platform CATGIXRF, as …
Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2
A new multipurpose x-ray reflectometer station has been developed and augmented at the
microfocus beamline (BL-16) of Indus-2 synchrotron radiation source to facilitate …
microfocus beamline (BL-16) of Indus-2 synchrotron radiation source to facilitate …
Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis
H Rotella, B Caby, Y Ménesguen, Y Mazel… - … Acta Part B: Atomic …, 2017 - Elsevier
The optical and electrical properties of transparent conducting oxide (TCO) thin films are
strongly linked with the structural and chemical properties such as elemental depth profile. In …
strongly linked with the structural and chemical properties such as elemental depth profile. In …