2013 Atomic spectrometry update—A review of advances in X-ray fluorescence spectrometry

M West, AT Ellis, PJ Potts, C Streli, C Vanhoof… - Journal of Analytical …, 2013 - pubs.rsc.org
This review comments on the ever expanding range of work using the XRF group of
techniques published approximately between April 2012 and March 2013. It presents …

An IAEA multi-technique X-ray spectrometry endstation at Elettra Sincrotrone Trieste: benchmarking results and interdisciplinary applications

AG Karydas, M Czyzycki, JJ Leani… - Journal of …, 2018 - journals.iucr.org
The International Atomic Energy Agency (IAEA) jointly with the Elettra Sincrotrone Trieste
(EST) operates a multipurpose X-ray spectrometry endstation at the X-ray Fluorescence …

Controlling core-hole lifetime through an x-ray planar cavity

XC Huang, XJ Kong, TJ Li, ZR Ma, HC Wang… - Physical Review …, 2021 - APS
It has long been believed that the core-hole lifetime (CHL) of an atom is an intrinsic physical
property, and controlling it is significant yet is very hard. Here, the CHL of the 2 p state of a W …

[書籍][B] High-resolution XAS/XES: analyzing electronic structures of catalysts

J Sá - 2014 - books.google.com
Photon-in-photon-out core level spectroscopy is an emerging approach to characterize the
electronic structure of catalysts and enzymes, and it is either installed or planned for intense …

[HTML][HTML] JGIXA—A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of …

D Ingerle, G Pepponi, F Meirer, P Wobrauschek… - … Acta Part B: Atomic …, 2016 - Elsevier
Grazing incidence XRF (GIXRF) is a very surface sensitive, nondestructive analytical tool
making use of the phenomenon of total external reflection of X-rays on smooth polished …

The research progress of an E//B neutral particle analyzer

MA Long, QU Yufan, LUO Yuan… - Plasma Science and …, 2024 - iopscience.iop.org
An// neutral particle analyzer (NPA) has been designed and is under development at
Sichuan University and Southwestern Institute of Physics. The main purpose of the// NPA is …

An interactive graphical user interface (GUI) for the CATGIXRF program – for microstructural evaluation of thin film and impurity doped surfaces

MK Tiwari, G Das - X‐Ray Spectrometry, 2016 - Wiley Online Library
This paper is a continuation and extension of our earlier work (X‐ray Spectrom. 2010, 39,
127–134, DOI: 10.1002/xrs. 1215) on the development of a software platform CATGIXRF, as …

Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2

G Das, SR Kane, A Khooha, AK Singh… - Review of Scientific …, 2015 - pubs.aip.org
A new multipurpose x-ray reflectometer station has been developed and augmented at the
microfocus beamline (BL-16) of Indus-2 synchrotron radiation source to facilitate …

Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis

H Rotella, B Caby, Y Ménesguen, Y Mazel… - … Acta Part B: Atomic …, 2017 - Elsevier
The optical and electrical properties of transparent conducting oxide (TCO) thin films are
strongly linked with the structural and chemical properties such as elemental depth profile. In …

Non-destructive elemental depth profiling of Ni/Ti multilayers by GIXRF technique

A Biswas, N Abharana, SN Jha… - Applied Surface Science, 2021 - Elsevier
In thin film multilayer along with total interface widths, study of individual interface widths of
the constituent elements of the multilayer is important for the knowledge of diffusion …