2013 Atomic spectrometry update—A review of advances in X-ray fluorescence spectrometry
M West, AT Ellis, PJ Potts, C Streli, C Vanhoof… - Journal of Analytical …, 2013 - pubs.rsc.org
This review comments on the ever expanding range of work using the XRF group of
techniques published approximately between April 2012 and March 2013. It presents …
techniques published approximately between April 2012 and March 2013. It presents …
An IAEA multi-technique X-ray spectrometry endstation at Elettra Sincrotrone Trieste: benchmarking results and interdisciplinary applications
AG Karydas, M Czyzycki, JJ Leani… - Journal of …, 2018 - journals.iucr.org
The International Atomic Energy Agency (IAEA) jointly with the Elettra Sincrotrone Trieste
(EST) operates a multipurpose X-ray spectrometry endstation at the X-ray Fluorescence …
(EST) operates a multipurpose X-ray spectrometry endstation at the X-ray Fluorescence …
Controlling core-hole lifetime through an x-ray planar cavity
XC Huang, XJ Kong, TJ Li, ZR Ma, HC Wang… - Physical Review …, 2021 - APS
It has long been believed that the core-hole lifetime (CHL) of an atom is an intrinsic physical
property, and controlling it is significant yet is very hard. Here, the CHL of the 2 p state of a W …
property, and controlling it is significant yet is very hard. Here, the CHL of the 2 p state of a W …
[書籍][B] High-resolution XAS/XES: analyzing electronic structures of catalysts
J Sá - 2014 - books.google.com
Photon-in-photon-out core level spectroscopy is an emerging approach to characterize the
electronic structure of catalysts and enzymes, and it is either installed or planned for intense …
electronic structure of catalysts and enzymes, and it is either installed or planned for intense …
[HTML][HTML] JGIXA—A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of …
D Ingerle, G Pepponi, F Meirer, P Wobrauschek… - … Acta Part B: Atomic …, 2016 - Elsevier
Grazing incidence XRF (GIXRF) is a very surface sensitive, nondestructive analytical tool
making use of the phenomenon of total external reflection of X-rays on smooth polished …
making use of the phenomenon of total external reflection of X-rays on smooth polished …
The research progress of an E//B neutral particle analyzer
MA Long, QU Yufan, LUO Yuan… - Plasma Science and …, 2024 - iopscience.iop.org
An// neutral particle analyzer (NPA) has been designed and is under development at
Sichuan University and Southwestern Institute of Physics. The main purpose of the// NPA is …
Sichuan University and Southwestern Institute of Physics. The main purpose of the// NPA is …
An interactive graphical user interface (GUI) for the CATGIXRF program – for microstructural evaluation of thin film and impurity doped surfaces
This paper is a continuation and extension of our earlier work (X‐ray Spectrom. 2010, 39,
127–134, DOI: 10.1002/xrs. 1215) on the development of a software platform CATGIXRF, as …
127–134, DOI: 10.1002/xrs. 1215) on the development of a software platform CATGIXRF, as …
Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2
A new multipurpose x-ray reflectometer station has been developed and augmented at the
microfocus beamline (BL-16) of Indus-2 synchrotron radiation source to facilitate …
microfocus beamline (BL-16) of Indus-2 synchrotron radiation source to facilitate …
Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis
H Rotella, B Caby, Y Ménesguen, Y Mazel… - … Acta Part B: Atomic …, 2017 - Elsevier
The optical and electrical properties of transparent conducting oxide (TCO) thin films are
strongly linked with the structural and chemical properties such as elemental depth profile. In …
strongly linked with the structural and chemical properties such as elemental depth profile. In …
Non-destructive elemental depth profiling of Ni/Ti multilayers by GIXRF technique
In thin film multilayer along with total interface widths, study of individual interface widths of
the constituent elements of the multilayer is important for the knowledge of diffusion …
the constituent elements of the multilayer is important for the knowledge of diffusion …