[BUCH][B] Silicon-on-insulator technology: materials to VLSI: materials to Vlsi

JP Colinge - 2004 - books.google.com
Silicon-on-Insulator Technology: Materials to VLSI, Third Edition, retraces the evolution of
SOI materials, devices and circuits over a period of roughly twenty years. Twenty years of …

The junctionless transistor

JP Colinge - Emerging devices for low-power and high …, 2018 - taylorfrancis.com
The junctionless transistor consists of a piece of uniformly doped semiconductor with a gate
placed between the source and drain contacts and is, therefore, the simplest transistor …

Characteristics and three-dimensional integration of MOSFET's in small-grain LPCVD polycrystalline silicon

SDS Malhi, H Shichijo, SK Banerjee… - IEEE transactions on …, 1985 - ieeexplore.ieee.org
Building on nearly two decades of reported results for MOSFET's fabricated in small-grain
polycrystalline silicon, a design methodology is developed that yields devices which have …

A quasi-two-dimensional analytical model for the turn-on characteristics of polysilicon thin-film transistors

PS Lin, JY Guo, CY Wu - IEEE transactions on electron devices, 1990 - ieeexplore.ieee.org
A physical model considering the effects of grain boundaries on the turn-on behavior of
polysilicon thin-film transistors (poly-Si TFTs) is presented. Along the channel, the formation …

Improved off-current and subthreshold slope in aggressively scaled poly-Si TFTs with a single grain boundary in the channel

PM Walker, H Mizuta, S Uno, Y Furuta… - IEEE Transactions on …, 2004 - ieeexplore.ieee.org
A polycrystalline-silicon thin-film transistor (TFT), with a single grain boundary (GB) present
in the channel, is simulated using two-dimensional numerical simulation, which includes a …

Quantifying random measurement errors in Voluntary Observing Ships' meteorological observations

EC Kent, DI Berry - … Journal of Climatology: A Journal of the …, 2005 - Wiley Online Library
Estimates of the random measurement error contained in surface meteorological
observations from Voluntary Observing Ships (VOS) have been made on a 30° area grid …

Breaking the subthreshold slope limit in MOSFETs

S Cristoloveanu, G Ghibaudo - Solid-State Electronics, 2022 - Elsevier
The Boltzmann limit of the subthreshold swing 2.3 kT/q in MOSFETs is a widely-
disseminated myth originated from a common amalgam between drain current and mobile …

Electrical characteristics of high-mobility fine-grain poly-Si TFTs from laser irradiated sputter-deposited Si film

T Serikawa, S Shirai, A Okamoto… - Japanese journal of …, 1989 - iopscience.iop.org
Electrical characteristics of n-channel fine-grain polycrystalline silicon thin-film transistors
(poly-Si TFTs) fabricated from a sputter-deposited Si film irradiated with laser light have …

Physics of gate modulated resonant tunneling (RT)-FETs: Multi-barrier MOSFET for steep slope and high on-current

A Afzalian, JP Colinge, D Flandre - Solid-state electronics, 2011 - Elsevier
A new concept of nanoscale MOSFET, the Gate Modulated Resonant Tunneling Transistor
(RT-FET), is presented and modeled using 3D Non-Equilibrium Green's Function …

A model of current—Voltage characteristics in polycrystalline silicon thin-film transistors

T Serikawa, S Shirai, A Okamoto… - IEEE transactions on …, 1987 - ieeexplore.ieee.org
An empirical model for the current-voltage characteristics of polycrystalline silicon thin-film
transistors is presented. The model was constructed based on the premise that the potential …