Shape of nanopores in track-etched polycarbonate membranes

S Dutt, P Apel, N Lizunov, C Notthoff, Q Wen… - Journal of Membrane …, 2021 - Elsevier
High aspect-ratio nanopores of nearly cylindrical geometry were fabricated by irradiation of
20 μm thick polycarbonate (PC) foils with Pb ions followed by UV sensitization and etching …

Unravelling the secrets of the resistance of GaN to strongly ionising radiation

MC Sequeira, JG Mattei, H Vazquez… - Communications …, 2021 - nature.com
GaN is the most promising upgrade to the traditional Si-based radiation-hard technologies.
However, the underlying mechanisms driving its resistance are unclear, especially for …

Fundamental phenomena and applications of swift heavy ion irradiations

M Lang, F Djurabekova, N Medvedev… - arxiv preprint arxiv …, 2020 - arxiv.org
This review concentrates on the specific properties and characteristics of damage structures
generated with high-energy ions in the electronic energy loss regime. Irradiation …

SAXS data modelling for the characterisation of ion tracks in polymers

X Wang, S Dutt, C Notthoff, A Kiy… - Physical Chemistry …, 2022 - pubs.rsc.org
Here, we present new models to fit small angle X-ray scattering (SAXS) data for the
characterization of ion tracks in polymers. Ion tracks in polyethylene terephthalate (PET) …

Nanoindentation testing of Si3N4 irradiated with swift heavy ions

EA Korneeva, A Ibrayeva, AJ van Vuuren… - Journal of Nuclear …, 2021 - Elsevier
We report the results of the nanoindentation tests of silicon nitride irradiated with Ar (46
MeV), Kr (107 MeV), Xe (167 MeV, 220 MeV) and Bi (710 MeV) ions. The behaviour of …

Etched ion tracks in amorphous SiO2 characterized by small angle x-ray scattering: Influence of ion energy and etching conditions

A Hadley, C Notthoff, P Mota-Santiago… - …, 2019 - iopscience.iop.org
Small angle x-ray scattering was used to study the morphology of conical structures formed
in thin films of amorphous SiO 2. Samples were irradiated with 1.1 GeV Au ions at the GSI …

Analysis of the microstructural evolution of silicon nitride irradiated with swift Xe ions

AJ van Vuuren, AD Ibrayeva, VA Skuratov… - Ceramics …, 2020 - Elsevier
Abstract The evolution of 220 MeV Xe ion induced radiation damage in polycrystalline Si 3 N
4 is studied, within the fluence range 5× 10 11–2× 10 14 cm− 2, using transmission electron …

[HTML][HTML] Annealing of swift heavy ion tracks in amorphous silicon dioxide

S Dutt, C Notthoff, X Wang, C Trautmann… - Applied Surface …, 2023 - Elsevier
The annealing kinetics of the high energy ion damage in amorphous silicon dioxide (a-SiO
2) are still not well understood, despite the material's widespread application in material …

[HTML][HTML] High-Energy Heavy Ion Tracks in Nanocrystalline Silicon Nitride

A Janse van Vuuren, A Mutali, A Ibrayeva, A Sohatsky… - Crystals, 2022 - mdpi.com
At present, silicon nitride is the only nitride ceramic in which latent ion tracks resulting from
swift heavy ion irradiation have been observed. Data related to the effects of SHIs on the …

Ion track etching of polycarbonate membranes monitored by in situ small angle X-ray scattering

A Kiy, C Notthoff, S Dutt, M Grigg, A Hadley… - Physical Chemistry …, 2021 - pubs.rsc.org
In situ small angle X-ray scattering (SAXS) measurements of ion track etching in
polycarbonate foils are used to directly monitor the selective dissolution of ion tracks with …