SDCTune: A model for predicting the SDC proneness of an application for configurable protection

Q Lu, K Pattabiraman, MS Gupta… - Proceedings of the 2014 …, 2014 - dl.acm.org
Silent Data Corruption (SDC) is a serious reliability issue in many domains, including
embedded systems. However, current protection techniques are brittle, and do not allow …

Configurable detection of SDC-causing errors in programs

Q Lu, G Li, K Pattabiraman, MS Gupta… - ACM Transactions on …, 2017 - dl.acm.org
Silent Data Corruption (SDC) is a serious reliability issue in many domains, including
embedded systems. However, current protection techniques are brittle and do not allow …

Dynamic code duplication with vulnerability awareness for soft error detection on VLIW architectures

J Lee, Y Ko, K Lee, JM Youn, Y Paek - ACM Transactions on Architecture …, 2013 - dl.acm.org
Soft errors are becoming a critical concern in embedded system designs. Code duplication
techniques have been proposed to increase the reliability in multi-issue embedded systems …

A new look at filtering techniques for illumination invariance in automatic face recognition

O Arandjelovic, R Cipolla - 7th International Conference on …, 2006 - ieeexplore.ieee.org
Illumination invariance remains the most researched, yet the most challenging aspect of
automatic face recognition. In this paper we propose a novel, general recognition framework …

Smart cache cleaning: Energy efficient vulnerability reduction in embedded processors

R Jeyapaul, A Shrivastava - … of the 14th international conference on …, 2011 - dl.acm.org
Incessant and rapid technology scaling has brought us to a point where todays, and future
transistors are susceptible to transient errors induced by energy carrying particles, called …

A fast and efficient technique to apply selective TMR through optimization

O Ruano, JA Maestro, P Reviriego - Microelectronics Reliability, 2011 - Elsevier
Fault tolerance is an important factor for circuits in critical applications, especially those
working in harsh environments. There are many techniques to increase reliability of circuits …

Enabling energy efficient reliability in embedded systems through smart cache cleaning

R Jeyapaul, A Shrivastava - ACM Transactions on Design Automation of …, 2013 - dl.acm.org
Incessant and rapid technology scaling has brought us to a point where today's, and future
transistors are susceptible to transient errors induced by energy carrying particles, called …

Partitioning techniques for partially protected caches in resource-constrained embedded systems

K Lee, A Shrivastava, N Dutt… - ACM Transactions on …, 2010 - dl.acm.org
Increasing exponentially with technology scaling, the soft error rate even in earth-bound
embedded systems manufactured in deep subnanometer technology is projected to become …

Revisiting symptom-based fault tolerant techniques against soft errors

H So, M Didehban, Y Ko, R Jeyapaul, J Kim, Y Kim… - Electronics, 2021 - mdpi.com
Aggressive technology scaling and near-threshold computing have made soft error reliability
one of the leading design considerations in modern embedded microprocessors. Although …

Performance and energy efficient asymmetrically reliable caches for multicore architectures

S Arslan, HR Topcuoglu, MT Kandemir… - 2015 IEEE …, 2015 - ieeexplore.ieee.org
Modern architectures are increasingly susceptible to transient and permanent faults due to
continuously decreasing transistor sizes and faster operating frequencies. The probability of …