Review of the recent progress on GaN-based vertical power Schottky barrier diodes (SBDs)
Y Sun, X Kang, Y Zheng, J Lu, X Tian, K Wei, H Wu… - Electronics, 2019 - mdpi.com
Gallium nitride (GaN)-based vertical power Schottky barrier diode (SBD) has demonstrated
outstanding features in high-frequency and high-power applications. This paper reviews …
outstanding features in high-frequency and high-power applications. This paper reviews …
Vertical power pn diodes based on bulk GaN
IC Kizilyalli, AP Edwards, O Aktas… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
There is a great interest in wide-bandgap semiconductor devices and most recently in
monolithic GaN structures for power electronics applications. In this paper, vertical pn diodes …
monolithic GaN structures for power electronics applications. In this paper, vertical pn diodes …
1.5-kV and 2.2-m -cm Vertical GaN Transistors on Bulk-GaN Substrates
H Nie, Q Diduck, B Alvarez, AP Edwards… - IEEE Electron …, 2014 - ieeexplore.ieee.org
In this letter, vertical GaN transistors fabricated on bulk GaN substrates are discussed. A
threshold voltage of 0.5 V and saturation current> 2.3 A are demonstrated. The measured …
threshold voltage of 0.5 V and saturation current> 2.3 A are demonstrated. The measured …
Impact ionization coefficients and critical electric field in GaN
Avalanche multiplication characteristics in a reverse-biased homoepitaxial GaN p–n junction
diode are experimentally investigated at 223–373 K by novel photomultiplication …
diode are experimentally investigated at 223–373 K by novel photomultiplication …
High voltage vertical GaN pn diodes with avalanche capability
IC Kizilyalli, AP Edwards, H Nie… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
In this paper, vertical pn diodes fabricated on pseudobulk gallium nitride (GaN) substrates
are discussed. The measured devices demonstrate breakdown voltages of 2600 V with a …
are discussed. The measured devices demonstrate breakdown voltages of 2600 V with a …
3.7 kV vertical GaN PN diodes
IC Kizilyalli, AP Edwards, H Nie, D Bour… - IEEE Electron …, 2013 - ieeexplore.ieee.org
There is a great interest in wide band-gap semiconductor devices for power electronics
application. In this letter, vertical GaN pn diodes fabricated on bulk GaN substrates are …
application. In this letter, vertical GaN pn diodes fabricated on bulk GaN substrates are …
50 A vertical GaN Schottky barrier diode on a free-standing GaN substrate with blocking voltage of 790 V
N Tanaka, K Hasegawa, K Yasunishi… - Applied Physics …, 2015 - iopscience.iop.org
This paper reports on vertical GaN Schottky barrier diodes (SBDs) fabricated on a free-
standing GaN substrate with different sizes of Schottky electrode. The fabricated SBDs with …
standing GaN substrate with different sizes of Schottky electrode. The fabricated SBDs with …
Single-chip boost converter using monolithically integrated AlGaN/GaN lateral field-effect rectifier and normally off HEMT
We demonstrate a single-chip switch-mode boost converter that features a monolithically
integrated lateral field-effect rectifier (L-FER) and a normally off transistor switch. The circuit …
integrated lateral field-effect rectifier (L-FER) and a normally off transistor switch. The circuit …
High-performance AlGaN∕ GaN lateral field-effect rectifiers compatible with high electron mobility transistors
A high electron mobility transistor (HEMT)-compatible power lateral field-effect rectifier (L-
FER) with low turn-on voltage is demonstrated using the same fabrication process as that for …
FER) with low turn-on voltage is demonstrated using the same fabrication process as that for …
Reliability studies of vertical GaN devices based on bulk GaN substrates
IC Kizilyalli, P Bui-Quang, D Disney, H Bhatia… - Microelectronics …, 2015 - Elsevier
There is great interest in wide band-gap semiconductor devices and most recently in vertical
GaN structures for power electronic applications. In this paper initial reliability studies of …
GaN structures for power electronic applications. In this paper initial reliability studies of …