[HTML][HTML] Atomic layer deposition (ALD) of metal gates for CMOS

C Zhao, J **ang - Applied Sciences, 2019 - mdpi.com
Featured Application Metal gate of CMOS devices. Abstract The continuous down-scaling of
complementary metal oxide semiconductor (CMOS) field effect transistors (FETs) had been …

Low-temperature microwave annealing processes for future IC fabrication—A review

YJ Lee, TC Cho, SS Chuang, FK Hsueh… - … on electron devices, 2014 - ieeexplore.ieee.org
Microwave annealing (MWA) and rapid thermal annealing (RTA) of dopants in implanted Si
are compared in their abilities to produce very shallow and highly activated junctions. First …

Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics

A Kerber, E Cartier, L Pantisano… - IEEE Electron …, 2003 - ieeexplore.ieee.org
The magnitude of the V/sub T/instability in conventional MOSFETs and MOS capacitors with
SiO/sub 2//HfO/sub 2/dual-layer gate dielectrics is shown to depend strongly on the details of …

Mobility measurement and degradation mechanisms of MOSFETs made with ultrathin high-k dielectrics

W Zhu, JP Han, TP Ma - IEEE Transactions on Electron …, 2004 - ieeexplore.ieee.org
Accurate measurements and degradation mechanisms of the channel mobility for MOSFETs
with HfO/sub 2/as the gate dielectric have been systematically studied in this paper. The …

Modeling study of ultrathin gate oxides using direct tunneling current and capacitance-voltage measurements in MOS devices

N Yang, WK Henson, JR Hauser… - IEEE Transactions on …, 1999 - ieeexplore.ieee.org
Using both quantum mechanical calculations for the silicon substrate and a modified WKB
approximation for the transmission probability, direct tunneling currents across ultra-thin …

[BOK][B] Handbook of silicon semiconductor metrology

AC Diebold - 2001 - books.google.com
Containing more than 300 equations and nearly 500 drawings, photographs, and
micrographs, this reference surveys key areas such as optical measurements and in-line …

Microcontact patterning of ruthenium gate electrodes by selective area atomic layer deposition

KJ Park, JM Doub, T Gougousi, GN Parsons - Applied Physics Letters, 2005 - pubs.aip.org
Patterned octadecyltrichlorosilane monolayers are used to inhibit film nucleation, enabling
selective area atomic layer deposition (ALD) of ruthenium on Si O 2 and Hf O 2 surfaces …

Physical and electrical properties of noncrystalline prepared by remote plasma enhanced chemical vapor deposition

RS Johnson, G Lucovsky, I Baumvol - Journal of Vacuum Science & …, 2001 - pubs.aip.org
Noncrystalline Al 2 O 3 dielectric films have been synthesized by remote plasma enhanced
chemical vapor deposition (RPECVD) and deposited on (i) H-terminated Si (100) and (ii) on …

Ternary rare-earth metal oxide high-k layers on silicon oxide

C Zhao, T Witters, B Brijs, H Bender, O Richard… - Applied Physics …, 2005 - pubs.aip.org
Ternary oxides, Gd Sc O 3⁠, Dy Sc O 3⁠, and La Sc O 3⁠, deposited by pulsed laser
deposition using ceramics targets of stoichiometric composition, were studied as alternative …

Thresholding Computing with Heterogeneous Integration of Memristive Kernel with Metal‐Oxide‐Semiconductor Capacitor for Temporal Data Analysis

SK Shim, K Lee, J Han, DH Shin, SH Lee… - Advanced …, 2024 - Wiley Online Library
Precise event detection within time‐series data is increasingly critical, particularly in noisy
environments. Reservoir computing, a robust computing method widely utilized with …