AI/ML algorithms and applications in VLSI design and technology

D Amuru, A Zahra, HV Vudumula, PK Cherupally… - Integration, 2023 - Elsevier
An evident challenge ahead for the integrated circuit (IC) industry is the investigation and
development of methods to reduce the design complexity ensuing from growing process …

High-definition routing congestion prediction for large-scale FPGAs

MB Alawieh, W Li, Y Lin, L Singhal… - 2020 25th Asia and …, 2020 - ieeexplore.ieee.org
To speed up the FPGA placement and routing closure, we propose a novel approach to
predict the routing congestion map for large-scale FPGA designs at the placement stage …

GeniusRoute: A new analog routing paradigm using generative neural network guidance

K Zhu, M Liu, Y Lin, B Xu, S Li, X Tang… - 2019 IEEE/ACM …, 2019 - ieeexplore.ieee.org
Due to sensitive layout-dependent effects and varied performance metrics, analog routing
automation for performance-driven layout synthesis is difficult to generalize. Existing …

Powernet: SOI lateral power device breakdown prediction with deep neural networks

J Chen, MB Alawieh, Y Lin, M Zhang, J Zhang… - IEEE …, 2020 - ieeexplore.ieee.org
The breakdown performance is a critical metric for power device design. This paper explores
the feasibility of efficiently predicting the breakdown performance of silicon on insulator (SOI) …

Machine learning-based edge placement error analysis and optimization: a systematic review

AT Ngo, B Dey, S Halder, S De Gendt… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
As the semiconductor manufacturing process is moving towards the 3 nm node, there is a
crucial need to reduce the edge placement error (EPE) to ensure proper functioning of the …

GridNet: Fast data-driven EM-induced IR drop prediction and localized fixing for on-chip power grid networks

H Zhou, W **, SXD Tan - … of the 39th International Conference on …, 2020 - dl.acm.org
Electromigration (EM) is a major failure effect for on-chip power grid networks of deep
submicron VLSI circuits. EM degradation of metal grid lines can lead to excessive voltage …

Full-chip thermal map estimation for commercial multi-core CPUs with generative adversarial learning

W **, S Sadiqbatcha, J Zhang, SXD Tan - Proceedings of the 39th …, 2020 - dl.acm.org
In this paper, we propose a novel transient full-chip thermal map estimation method for multi-
core commercial CPU based on the data-driven generative adversarial learning method. We …

DeePattern: Layout pattern generation with transforming convolutional auto-encoder

H Yang, P Pathak, F Gennari, YC Lai, B Yu - Proceedings of the 56th …, 2019 - dl.acm.org
VLSI layout patterns provide critic resources in various design for manufacturability
researches, from early technology node development to back-end design and sign-off flows …

Em-gan: Data-driven fast stress analysis for multi-segment interconnects

W **, S Sadiqbatcha, Z Sun, H Zhou… - 2020 IEEE 38th …, 2020 - ieeexplore.ieee.org
Electromigration (EM) analysis for complicated interconnects requires the solving of partial
differential equations, which is expensive. In this paper, we propose a fast transient …

Adversarial perturbation attacks on ML-based CAD: A case study on CNN-based lithographic hotspot detection

K Liu, H Yang, Y Ma, B Tan, B Yu, EFY Young… - ACM Transactions on …, 2020 - dl.acm.org
There is substantial interest in the use of machine learning (ML)-based techniques
throughout the electronic computer-aided design (CAD) flow, particularly those based on …