[HTML][HTML] A general approach for degradation modeling to enable a widespread use of aging simulations in IC design
A Lange, FAV Gonzalez, KU Giering… - Microelectronics …, 2022 - Elsevier
The importance of integrated circuit (IC) reliability has been growing to benefit from the
potentials of advanced semiconductor technologies in long-living applications, such as …
potentials of advanced semiconductor technologies in long-living applications, such as …
Challenges and solution approaches for simulation-based reliability assessment–degradation modeling
A Lange, R Jancke - 2020 IEEE International Integrated …, 2020 - ieeexplore.ieee.org
To verify the reliability of electronic circuits and systems in automotive applications,
qualification according to the industry-standards, such as AEC-QIOO, is state of the art. But …
qualification according to the industry-standards, such as AEC-QIOO, is state of the art. But …
A Compact Model of FTJ Covering the Trap**/De-trap** Charateristics
N Feng, N Ji, F Zhang, Y Li, P Cai, H Li… - … on Simulation of …, 2023 - ieeexplore.ieee.org
Trap effects in the metal-ferroelectric-silicon (MFS) FTJs are modeled in this work. From the
charge conservation and voltage balancing principles, traps at the interface between the …
charge conservation and voltage balancing principles, traps at the interface between the …
Nvdl-cache: Narrow-width value aware variable delay low-power data cache
Cache memories dissipate a large portion of processors' power budget. On the other hand,
due to unbalanced stress condition on their SRAMs, aging of cache memories is one of the …
due to unbalanced stress condition on their SRAMs, aging of cache memories is one of the …
Design Support for Reliable Integrated Circuits
S Crocoll, A Lange - … in Microelectronics Reliability: Contributions from the …, 2024 - Springer
Integrated circuits (ICs) are the basis for almost all microelectronic applications independent
of their particular target market segments. Therefore, to make microelectronic systems …
of their particular target market segments. Therefore, to make microelectronic systems …
Switching Transients Optimization and Investigations into Threshold Voltage Shift for SiC MOSFETs using a Current-Controlled Gate Driver
X Wang - 2022 - theses.ncl.ac.uk
Silicon Carbide Metal-Oxide Semiconductor Field Effect Transistors (SiC MOSFET) show
superior properties over conventional silicon (Si) based MOSFETs: featuring higher voltage …
superior properties over conventional silicon (Si) based MOSFETs: featuring higher voltage …
A time-dependent Verilog-A compact model for MOS capacitors with interface traps
K Fukuda, H Asai, J Hattori, M Shimizu… - Japanese Journal of …, 2019 - iopscience.iop.org
A modeling method to analyze transient behaviors of MOS capacitors including interface
traps by circuit simulation is proposed. Through applications to GaN MOS capacitors …
traps by circuit simulation is proposed. Through applications to GaN MOS capacitors …
[PDF][PDF] Degradation modeling and validation–bottlenecks for standard use of aging simulations in IC design
A Lange, R Jancke - 2020 - publica-rest.fraunhofer.de
AEC-Q100 is state of the art to verify the reliability of integrated circuits that are applied in
automotive electronics. However, there are indications that this will not be sufficient for future …
automotive electronics. However, there are indications that this will not be sufficient for future …