Accurate multibias equivalent-circuit extraction for GaN HEMTs

G Crupi, D **ao, DMMP Schreurs… - IEEE transactions on …, 2006 - ieeexplore.ieee.org
This paper focuses on the determination and analysis of an accurate small-signal equivalent
circuit for gallium-nitride high electron-mobility transistors under different bias conditions …

DC and low-frequency noise characteristics of GaN-based HEMTs under cryogenic temperatures

B Zeng, H Zhang, C Luo, Z **ang… - Journal of Physics D …, 2022 - iopscience.iop.org
In this work, the device characteristics of GaN-based high-electron-mobility transistors
(HEMTs) were systematically investigated by the direct current (DC) and low-frequency …

The large world of FET small‐signal equivalent circuits

G Crupi, A Caddemi, DMMP Schreurs… - … Journal of RF and …, 2016 - Wiley Online Library
The small‐signal equivalent circuit modeling of microwave field‐effect transistors (FETs) is
an evergreen and ever flourishing research field that has to be up‐to‐date with …

Measurement-based extraction and analysis of a temperature-dependent equivalent-circuit model for a SAW resonator: From room down to cryogenic temperatures

G Crupi, G Gugliandolo, G Campobello… - IEEE Sensors …, 2021 - ieeexplore.ieee.org
This article provides for the first time a very extensive experimental characterization coupled
with a fully analytical modeling in order to investigate, in a systematic and comprehensive …

An Extensive Experimental Analysis of the Kink Effects in and for a GaN HEMT

G Crupi, A Raffo, Z Marinković, G Avolio… - IEEE Transactions …, 2014 - ieeexplore.ieee.org
This paper, for the first time, analyzes in detail the kink phenomenon in S 22 as observed in
GaN HEMT technology. To gain a comprehensive understanding, the kink effect (KE) is …

A new millimeter-wave small-signal modeling approach for pHEMTs accounting for the output conductance time delay

G Crupi, DMMP Schreurs, A Raffo… - IEEE transactions on …, 2008 - ieeexplore.ieee.org
A new technique is developed for determining analytically a millimeter-wave small-signal
equivalent-circuit model of GaAs pseudomorphic HEMTs from scattering parameter …

Cryogenic characterization and analysis of nanoscale SOI FETs using a virtual source model

G Zhou, F Al Mamun, J Yang-Scharlotta… - … on Electron Devices, 2022 - ieeexplore.ieee.org
This article reports the temperature-dependent characterization and analysis of quasi-
ballistic transport in fully depleted silicon-on-insulator (FD-SOI) metal-oxide-semiconductor …

Lumped-element equivalent-circuit modeling of millimeter-wave HEMT parasitics through full-wave electromagnetic analysis

Y Karisan, C Caglayan… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
We present a broadband lumped-element parasitic equivalent circuit to accurately capture
the frequency response of electromagnetic (EM) interactions inside the structure and …

Small signal model parameters analysis of GaN and GaAs based HEMTs over temperature for microwave applications

MA Alim, AA Rezazadeh, C Gaquiere - Solid-state electronics, 2016 - Elsevier
Thermal and small-signal model parameters analysis have been carried out on 0.5 μm×(2×
100 μm) AlGaAs/GaAs HEMT grown on semi-insulating GaAs substrate and 0.25 μm×(2× …

On the small signal modeling of advanced microwave FETs: A comparative study

G Crupi, DMMP Schreurs… - International Journal of RF …, 2008 - Wiley Online Library
Although many successful techniques have been proposed in the last decades for extracting
the small signal equivalent circuit for microwave transistors from scattering parameter …