Group III-nitride-based ultraviolet light-emitting diodes: ways of increasing external quantum efficiency
There is a rapidly growing demand for highly efficient ultraviolet (UV) light sources for a wide
variety of applications. In particular, state-of-the-art AlGaN deep UV light-emitting diodes …
variety of applications. In particular, state-of-the-art AlGaN deep UV light-emitting diodes …
Status and challenges in hetero-epitaxial growth approach for large diameter AlN single crystalline substrates
RR Sumathi - ECS Journal of Solid State Science and …, 2021 - iopscience.iop.org
Aluminium nitride (AlN) crystalline substrate has emerged as a striking material and
received tremendous attention for applications in high power electronics (HPE), deep …
received tremendous attention for applications in high power electronics (HPE), deep …
High quality AlGaN grown on ELO AlN/sapphire templates
U Zeimer, V Kueller, A Knauer, A Mogilatenko… - Journal of crystal …, 2013 - Elsevier
The defect structure and the homogeneity of 1–3 µm thick Al x Ga 1− x N layers grown on
epitaxially laterally overgrown (ELO) AlN on patterned AlN/sapphire templates have been …
epitaxially laterally overgrown (ELO) AlN on patterned AlN/sapphire templates have been …
Carrier localization structure combined with current micropaths in AlGaN quantum wells grown on an AlN template with macrosteps
K Kojima, Y Nagasawa, A Hirano… - Applied Physics …, 2019 - pubs.aip.org
The microscopic structural and optical characteristics of AlGaN-based light-emitting diodes
grown on AlN templates with macrosteps were evaluated. Cross-sectional transmission …
grown on AlN templates with macrosteps were evaluated. Cross-sectional transmission …
Defect analysis in AlGaN layers on AlN templates obtained by epitaxial lateral overgrowth
A Mogilatenko, V Küller, A Knauer, J Jeschke… - Journal of crystal …, 2014 - Elsevier
The defect distribution in thick AlN layers obtained by epitaxial lateral overgrowth (ELO-AlN)
has been analyzed as a function of the miscut direction of the patterned sapphire substrate …
has been analyzed as a function of the miscut direction of the patterned sapphire substrate …
Design of Hole-Blocking and Electron-Blocking Layers in AlxGa1–xN-Based UV Light-Emitting Diodes
YH Shih, JY Chang, JK Sheu, YK Kuo… - … on Electron Devices, 2016 - ieeexplore.ieee.org
The band-engineered structure design for electron-blocking layer (EBL) and hole-blocking
layer (HBL) in Al x Ga 1–x N-based ultraviolet light-emitting diodes (UV LEDs) is performed …
layer (HBL) in Al x Ga 1–x N-based ultraviolet light-emitting diodes (UV LEDs) is performed …
Picosecond-laser-excited photoluminescence study of AlGaN quantum wells on epitaxially laterally overgrown AlN/sapphire under selective and non-selective …
S Tanaka, R Ishii, N Susilo, T Wernicke… - Japanese Journal of …, 2022 - iopscience.iop.org
The radiative recombination efficiency (RRE) of AlGaN quantum wells on epitaxially laterally
overgrown AlN/sapphire templates was investigated by picosecond-laser–excited …
overgrown AlN/sapphire templates was investigated by picosecond-laser–excited …
Nanoscale phase separation on an AlGaN surface characterized by scanning diffusion microscopy
B Liu, Z Liu, G Xu, W Song, C Zhang, K Chen, S Han… - Optics …, 2023 - opg.optica.org
AlGaN is an important material for deep ultraviolet optoelectronic devices and electronic
devices. The phase separation on the AlGaN surface means small-scale compositional …
devices. The phase separation on the AlGaN surface means small-scale compositional …
[HTML][HTML] Influence of substrate miscut angle on surface morphology and luminescence properties of AlGaN
The influence of substrate miscut on Al 0.5 Ga 0.5 N layers was investigated using
cathodoluminescence (CL) hyperspectral imaging and secondary electron imaging in an …
cathodoluminescence (CL) hyperspectral imaging and secondary electron imaging in an …
[HTML][HTML] Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0. 82Ga0. 18N
A series of Si-doped AlN-rich AlGaN layers with low resistivities was characterized by a
combination of nanoscale imaging techniques. Utilizing the capability of scanning electron …
combination of nanoscale imaging techniques. Utilizing the capability of scanning electron …