Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
Accelerometer calibration and dynamic bias and gravity estimation: Analysis, design, and experimental evaluation
Tri-axial linear accelerometers are key components in a great variety of applications and, in
particular, in navigation systems. Nonidealities such as scale factors, cross coupling, bias …
particular, in navigation systems. Nonidealities such as scale factors, cross coupling, bias …
[HTML][HTML] A scale factor calibration method for MEMS resonant accelerometers based on virtual accelerations
Z Zhai, X **ong, L Ma, Z Wang, K Wang, B Wang… - Micromachines, 2023 - mdpi.com
This paper presents a scale factor calibration method based on virtual accelerations
generated by electrostatic force. This method uses a series of voltage signals to simulate the …
generated by electrostatic force. This method uses a series of voltage signals to simulate the …
GridMiner: a fundamental infrastructure for building intelligent grid systems
P Brezany, I Janciak, AM Tjoa - The 2005 IEEE/WIC/ACM …, 2005 - ieeexplore.ieee.org
The grid is considered as a crucial technology for the future knowledge-based economy and
science. The Wisdom Grid project (a joint research effort of the University of Vienna and the …
science. The Wisdom Grid project (a joint research effort of the University of Vienna and the …
Digital platform for wafer-level MEMS testing and characterization using electrical response
The uniqueness of microelectromechanical system (MEMS) devices, with their multiphysics
characteristics, presents some limitations to the borrowed test methods from traditional …
characteristics, presents some limitations to the borrowed test methods from traditional …
Identification and adjustment of the position and attitude for the electrostatic accelerometer's proof mass
D Fan, Y Liu, F Han, J Dong - Sensors and Actuators A: Physical, 2012 - Elsevier
In an electrostatic force feedback accelerometer (EFFA1) system, nonlinearities in the
transfer function between the input acceleration and the output voltage signal are mainly …
transfer function between the input acceleration and the output voltage signal are mainly …
A behavioral model of MEMS convective accelerometers for the evaluation of design and calibration strategies at system level
This paper presents a behavioral model that can be used to improve the manufacturability of
systems based on MEMS convective sensors. This model permits to handle faults related to …
systems based on MEMS convective sensors. This model permits to handle faults related to …
Evaluation of a fully electrical test and calibration method for MEMS capacitive accelerometers
This paper presents an evaluation of a fully electrical test and calibration method for MEMS
capacitive accelerometers. The method is based on analytical expressions of the sensitivity …
capacitive accelerometers. The method is based on analytical expressions of the sensitivity …
Fully electrical test procedure for inertial MEMS characterization at wafer-level
A Sisto, O Schwarzelbach… - Proceedings of the 2013 …, 2013 - ieeexplore.ieee.org
The fast growth of MEMS technologies for the production of inertial sensors in the last
decade makes the characterization at wafer-level very important. In this paper is presented a …
decade makes the characterization at wafer-level very important. In this paper is presented a …
New electro-thermally actuated micromanipulator with optimized design and FEM simulations analyses
R Voicu, R Muller - … Symposium on Design, Test, Integration and …, 2013 - ieeexplore.ieee.org
This paper presents the designs for a new configuration of an electro-thermally actuated SU-
8 polymeric micro-manipulator. The electro-thermally driven micromanipulators were studied …
8 polymeric micro-manipulator. The electro-thermally driven micromanipulators were studied …
An electrical test method for MEMS convective accelerometers: development and evaluation
In this paper, an alternative test method for MEMS convective accelerometers is presented. It
is first demonstrated that device sensitivity can be determined without the use of physical test …
is first demonstrated that device sensitivity can be determined without the use of physical test …