Low‐Frequency Current Fluctuations in Quasi‐1D (TaSe4)2I Weyl Semimetal Nanoribbons

S Ghosh, F Kargar, NR Sesing, Z Barani… - Advanced Electronic …, 2023 - Wiley Online Library
Low‐frequency current fluctuations, ie, electronic noise, in quasi‐1D (TaSe4) 2I Weyl
semimetal nanoribbons are discussed. It is found that the noise spectral density is of the 1/f …

1/f noise of short-channel indium tin oxide transistors under stress

C Gu, Q Hu, Q Li, S Zhu, J Kang, Y Wu - Applied Physics Letters, 2023 - pubs.aip.org
In this work, we investigate the reliability and stability of short-channel indium tin oxide (ITO)
field-effect transistors through 1/f noise characterization at elevated temperature with …

[HTML][HTML] Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pum**, and 1/f noise …

R Asanovski, J Franco, P Palestri, B Kaczer… - Solid-State Electronics, 2023 - Elsevier
Dielectric defects play a crucial role in the reliability of MOSFETs. In this study, we aim to
gain a deeper understanding of dielectrics' degradation by correlating the effective interface …

Exploring the Impact of Channel Thickness Scaling on PBTI and Low-Frequency Noise in Ultrathin IGZO Transistors

G Liu, Q Kong, X Wang, YH Tu, Z Zheng… - … on Electron Devices, 2024 - ieeexplore.ieee.org
This study presents a thorough investigation into the influence of channel thickness () on the
positive bias temperature instability (PBTI) and low-frequency noise (LFN) characteristics of …

Random Telegraph Noise of MIS and MIOS Silicon Nitride memristors at different resistance states

N Vasileiadis, P Loukas, A Mavropoulis… - 2022 IEEE 22nd …, 2022 - ieeexplore.ieee.org
Resistive memories (RRAM) are promising candidates for replacing present nonvolatile
memories and realizing storage class memories; hence resistance switching devices are of …

Power spectra of pressure pulsations in the processes of evaporation/boiling of a liquid at low pressures

AE Brester, VI Zhukov, DA Shvetsov… - Journal of Physics …, 2021 - iopscience.iop.org
This paper presents experimental data on pressure fluctuations during evaporation/boiling
of a thin liquid film under conditions of reduced pressure. The experimental data were …

Low-Frequency Noise in Quasi-1D (TaSe)I Weyl Semimetal Nanoribbons

S Ghosh, F Kargar, NR Sesing, Z Barani… - ar**
C Gu, C Zhou, DS Ang, X Ju, R Gu… - Journal of Applied Physics, 2019 - pubs.aip.org
Current understanding of the bias temperature instability degradation usually comprises two
parts:(1) shallow-level component that can recover within a short time and (2) deep level …

PBTI stress-induced 1/f noise in n-channel FinFET

DY Chen, JS Bi, K **, G Wang - Chinese Physics B, 2020 - iopscience.iop.org
The influence of positive bias temperature instability (PBTI) on 1/f noise performance is
systematically investigated on n-channel fin field-effect transistor (FinFET). The FinFET with …

Flicker noise in two-dimensional electron gas

MN Najafi, S Tizdast, Z Moghaddam… - Physica …, 2021 - iopscience.iop.org
Using the method developed in a recent paper (2019 Euro. Phys. J. B92 1–28) we consider
1/f noise in two-dimensional electron gas (2DEG). The electron coherence length of the …