Recent advances and challenges in silicon carbide (SiC) ceramic nanoarchitectures and their applications

M Xu, YR Girish, KP Rakesh, P Wu… - Materials Today …, 2021 - Elsevier
Silicon carbide (SiC) is recognized as a notable semiconductor because of its outstanding
characteristics, for instance wide-bandgap, outstanding magnetic properties, extraordinary …

Novel photonic applications of silicon carbide

H Ou, X Shi, Y Lu, M Kollmuss, J Steiner, V Tabouret… - Materials, 2023 - mdpi.com
Silicon carbide (SiC) is emerging rapidly in novel photonic applications thanks to its unique
photonic properties facilitated by the advances of nanotechnologies such as nanofabrication …

Review of SiC crystal growth technology

PJ Wellmann - Semiconductor Science and Technology, 2018 - iopscience.iop.org
The review article describes the interplay of fundamental research and advanced processes
that have made SiC a unique semiconductor material for power electronic devices. Related …

Power Electronic Semiconductor Materials for Automotive and Energy Saving Applications – SiC, GaN, Ga2O3, and Diamond

PJ Wellmann - Zeitschrift für anorganische und allgemeine …, 2017 - Wiley Online Library
Power electronics belongs to the future key technologies in order to increase system
efficiency as well as performance in automotive and energy saving applications. Silicon is …

Silica on silicon carbide

V Presser, KG Nickel - Critical reviews in solid state and materials …, 2008 - Taylor & Francis
Silicon carbide (SiC) as both the most important non-oxide ceramic and promising
semiconductor material grows stoichiometric SiO 2 as its native oxide. During passive …

Dislocations in 4H silicon carbide

J Li, G Yang, X Liu, H Luo, L Xu, Y Zhang… - Journal of Physics D …, 2022 - iopscience.iop.org
Owing to the superior properties of the wide bandgap, high carrier mobility, high thermal
conductivity and high stability, 4H silicon carbide (4H-SiC) holds great promise for …

[HTML][HTML] Revisiting stacking fault identification based on the characteristic photoluminescence emission wavelengths of silicon carbide epitaxial wafers

M Na, W Bahng, H Jung, C Oh, D Jang… - Materials Science in …, 2024 - Elsevier
We revisited stacking fault identification based on the characteristic photoluminescence
emission wavelengths of 4H–SiC epitaxial wafers, and we investigated 50 000 stacking …

[KIRJA][B] Extended defects in semiconductors: electronic properties, device effects and structures

DB Holt, BG Yacobi - 2007 - books.google.com
The elucidation of the effects of structurally extended defects on electronic properties of
materials is especially important in view of the current advances in electronic device …

Electronic and Optical Properties of Threading Dislocations in n-Type 4H-SiC

H Luo, J Li, G Yang, R Zhu, Y Zhang… - ACS Applied …, 2022 - ACS Publications
Despite the decades of development of the single-crystal growth and homoepitaxy of 4H
silicon carbide (4H-SiC), high-density threading dislocations (TDs) still remain in 4H-SiC. In …

Analysis of dislocation configurations in SiC crystals through X-ray topography aided by ray tracing simulations

Q Cheng, Z Chen, S Hu, Y Liu… - Materials Science in …, 2024 - Elsevier
Silicon carbide as a wide bandgap semiconductor is of great research interest for its
widespread deployment in a range of electronic and optoelectronic devices, particularly in …