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[HTML][HTML] Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters
Despite numerous tutorials and standards written to the technical community on X-ray
photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting …
photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting …
XPS in industry—Problems with binding energies in journals and binding energy databases
BV Crist - Journal of Electron Spectroscopy and Related …, 2019 - Elsevier
Experimentally measured BEs are commercially available in various forms, eg scientific
journals, handbooks, internet based data-banks, computer-based data-banks of BEs or …
journals, handbooks, internet based data-banks, computer-based data-banks of BEs or …
Chemometrics
SD Brown, TB Blank, ST Sum, LG Weyer - Analytical chemistry, 1994 - ACS Publications
INTRODUCTION Chemometrics is the discipline concerned with the ap-plication of statistical
and mathematical methods, as well as those methods based on mathematical logic, to …
and mathematical methods, as well as those methods based on mathematical logic, to …
Chemical state quantification of iron and chromium oxides using XPS: the effect of the background subtraction method
M Aronniemi, J Sainio, J Lahtinen - Surface Science, 2005 - Elsevier
Quantitative chemical analysis based on X-ray photoelectron spectroscopy (XPS) includes
elemental identification and, in many cases, quantification of the chemical states of active …
elemental identification and, in many cases, quantification of the chemical states of active …
Angle-resolved XPS and AES: depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods
PJ Cumpson - Journal of Electron Spectroscopy and Related …, 1995 - Elsevier
Many algorithms for calculating concentration depth profiles (CDPs) from ARXPS or ARAES
measurements have been published over the last decade, ranging from simple least …
measurements have been published over the last decade, ranging from simple least …
Definition of a new (Doniach‐Sunjic‐Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra
B Moeini, MR Linford, N Fairley… - Surface and …, 2022 - Wiley Online Library
The existence of asymmetry in X‐ray photoelectron spectroscopy (XPS) photoemission lines
is widely accepted, but line shapes designed to accommodate asymmetry are generally …
is widely accepted, but line shapes designed to accommodate asymmetry are generally …
Characterization of the ageing of plasma‐deposited polymer films: Global analysis of X‐ray photoelectron spectroscopy data
TR Gengenbach, RC Chatelier… - Surface and Interface …, 1996 - Wiley Online Library
A protocol for global analysis of x‐ray photoelectron spectra of plasma‐deposited polymer
films is presented. These materials are difficult to analyse because of the multitude of …
films is presented. These materials are difficult to analyse because of the multitude of …
Interpretation of XPS O (1s) in mixed oxides proved on mixed perovskite crystals
DA Pawlak, M Ito, M Oku, K Shimamura… - The Journal of …, 2002 - ACS Publications
Mixed perovskites (AA ')(BB ') O3, where A= La or Nd, A '= Sr, B= Al or Ga, and B '= Ta or Nb,
were investigated by X-ray photoelectron spectroscopy (XPS). The interpretation of XPS O …
were investigated by X-ray photoelectron spectroscopy (XPS). The interpretation of XPS O …
UV-Induced Reaction Pathways in Bromoform Probed with Ultrafast Electron Diffraction
L Hoffmann, BW Toulson, J Yang… - Journal of the …, 2024 - ACS Publications
For many chemical reactions, it remains notoriously difficult to predict and experimentally
determine the rates and branching ratios between different reaction channels. This is …
determine the rates and branching ratios between different reaction channels. This is …
Metal Nitride Electrode Stress and Chemistry Effects on Phase and Polarization Response in Ferroelectric Hf0.5Zr0.5O2 Thin Films
Ferroelectric phase stability in hafnium oxide is reported to be influenced by factors that
include composition, biaxial stress, crystallite size, and oxygen vacancies. In the present …
include composition, biaxial stress, crystallite size, and oxygen vacancies. In the present …