Reliability-aware runtime power management for many-core systems in the dark silicon era

AM Rahmani, MH Haghbayan, A Miele… - … Transactions on Very …, 2016 - ieeexplore.ieee.org
Power management of networked many-core systems with runtime application map**
becomes more challenging in the dark silicon era. It necessitates considering network …

A lifetime-aware runtime map** approach for many-core systems in the dark silicon era

MH Haghbayan, A Miele, AM Rahmani… - … , Automation & Test …, 2016 - ieeexplore.ieee.org
In this paper, we propose a novel lifetime reliability-aware resource management approach
for many-core architectures. The approach is based on hierarchical architecture, composed …

Performance/reliability-aware resource management for many-cores in dark silicon era

MH Haghbayan, A Miele, AM Rahmani… - IEEE Transactions …, 2017 - ieeexplore.ieee.org
Aggressive technology scaling has enabled the fabrication of many-core architectures while
triggering challenges such as limited power budget and increased reliability issues, like …

Run-time resource management in CMPs handling multiple aging mechanisms

H Haghbayan, A Miele, O Mutlu… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Run-time resource management is fundamental for efficient execution of workloads on Chip
Multiprocessors. Application-and system-level requirements (eg, on performance versus …

Optimal functional-unit assignment for heterogeneous systems under timing constraint

W Jiang, EHM Sha, X Chen, L Yang… - … on Parallel and …, 2017 - ieeexplore.ieee.org
In high-level synthesis for real-time systems, it typically employs heterogeneous functional-
unit types to achieve high-performance and low-cost designs. In the design phase, it is …

Electromigration-aware local-via allocation in power/ground TSVs of 3-D ICs

S Wang, MB Tahoori - IEEE Transactions on Very Large Scale …, 2017 - ieeexplore.ieee.org
With increasing temperature and current density, electromigration (EM) becomes a major
interconnect reliability concern for 3-D integrated-circuits (3-D ICs). In 3-D power delivery …

[책][B] Physics-Based Electromigration Modeling and Analysis and Optimization

Z Sun - 2020 - search.proquest.com
Long-term reliability is a major concern in modern VLSI design. Literature has shown that
reliability gets worse as technology advances. It is expected that the future VLSI systems …

Mttf-aware reliability task scheduling for heterogeneous multicore system

H Liang, Y Dai, M Yi, D Xu, Z Huang - … 18-20, 2015, Proceedings, Part II 15, 2015 - Springer
With silicon technology aggressively scaling, the aging-induced long-term reliability
becomes the prominent problem of integrated circuits. The reliability of homogeneous multi …

[PDF][PDF] Reliable Design of Three-Dimensional Integrated Circuits

S Wang - 2018 - core.ac.uk
Beginning with the invention of the first Integrated Circuit (IC) by Kilby and Noyce in 1959,
performance growth in IC is realized primarily by geometrical scaling, which has resulted in …

DRM and Optimization for Real-Time Embedded Systems

S Tan, M Tahoori, T Kim, S Wang, Z Sun… - Long-Term Reliability of …, 2019 - Springer
This chapter presents a new lifetime optimization techniques for real-time embedded
processors considering the electromigration-induced reliability. For real-time embedded …