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Reliability-aware runtime power management for many-core systems in the dark silicon era
Power management of networked many-core systems with runtime application map**
becomes more challenging in the dark silicon era. It necessitates considering network …
becomes more challenging in the dark silicon era. It necessitates considering network …
A lifetime-aware runtime map** approach for many-core systems in the dark silicon era
In this paper, we propose a novel lifetime reliability-aware resource management approach
for many-core architectures. The approach is based on hierarchical architecture, composed …
for many-core architectures. The approach is based on hierarchical architecture, composed …
Performance/reliability-aware resource management for many-cores in dark silicon era
Aggressive technology scaling has enabled the fabrication of many-core architectures while
triggering challenges such as limited power budget and increased reliability issues, like …
triggering challenges such as limited power budget and increased reliability issues, like …
Run-time resource management in CMPs handling multiple aging mechanisms
Run-time resource management is fundamental for efficient execution of workloads on Chip
Multiprocessors. Application-and system-level requirements (eg, on performance versus …
Multiprocessors. Application-and system-level requirements (eg, on performance versus …
Optimal functional-unit assignment for heterogeneous systems under timing constraint
In high-level synthesis for real-time systems, it typically employs heterogeneous functional-
unit types to achieve high-performance and low-cost designs. In the design phase, it is …
unit types to achieve high-performance and low-cost designs. In the design phase, it is …
Electromigration-aware local-via allocation in power/ground TSVs of 3-D ICs
S Wang, MB Tahoori - IEEE Transactions on Very Large Scale …, 2017 - ieeexplore.ieee.org
With increasing temperature and current density, electromigration (EM) becomes a major
interconnect reliability concern for 3-D integrated-circuits (3-D ICs). In 3-D power delivery …
interconnect reliability concern for 3-D integrated-circuits (3-D ICs). In 3-D power delivery …
[책][B] Physics-Based Electromigration Modeling and Analysis and Optimization
Z Sun - 2020 - search.proquest.com
Long-term reliability is a major concern in modern VLSI design. Literature has shown that
reliability gets worse as technology advances. It is expected that the future VLSI systems …
reliability gets worse as technology advances. It is expected that the future VLSI systems …
Mttf-aware reliability task scheduling for heterogeneous multicore system
H Liang, Y Dai, M Yi, D Xu, Z Huang - … 18-20, 2015, Proceedings, Part II 15, 2015 - Springer
With silicon technology aggressively scaling, the aging-induced long-term reliability
becomes the prominent problem of integrated circuits. The reliability of homogeneous multi …
becomes the prominent problem of integrated circuits. The reliability of homogeneous multi …
[PDF][PDF] Reliable Design of Three-Dimensional Integrated Circuits
S Wang - 2018 - core.ac.uk
Beginning with the invention of the first Integrated Circuit (IC) by Kilby and Noyce in 1959,
performance growth in IC is realized primarily by geometrical scaling, which has resulted in …
performance growth in IC is realized primarily by geometrical scaling, which has resulted in …
DRM and Optimization for Real-Time Embedded Systems
This chapter presents a new lifetime optimization techniques for real-time embedded
processors considering the electromigration-induced reliability. For real-time embedded …
processors considering the electromigration-induced reliability. For real-time embedded …