An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage

J Diaz-Fortuny, P Saraza-Canflanca, E Bury… - Micromachines, 2024 - mdpi.com
The reliability and durability of integrated circuits (ICs), present in almost every electronic
system, from consumer electronics to the automotive or aerospace industries, have been …

Improving the Tamper-Aware odometer concept by enhancing dynamic stress operation

J Diaz-Fortuny, D Sangani… - 2023 IEEE …, 2023 - ieeexplore.ieee.org
On-chip degradation monitors have recently gained significant relevance because they can
provide real-time estimations of IC reliability by exploiting the fundamental physics of BTI …

Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology

J Diaz-Fortuny, P Saraza-Canflanca… - 2024 IEEE …, 2024 - ieeexplore.ieee.org
Integrated circuits (IC) are the heart of all electronic systems in critical sectors like
automotive, aerospace, or healthcare, in key infrastructures like telecommunications …

Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor

H Amrouch, VM van Santen… - 2024 IEEE …, 2024 - ieeexplore.ieee.org
In ever-shrinking technology nodes, where transistor 3D structures become increasingly
confined and their features verge on the atomic scale, the phenomena of aging and self …

Characterization setup for the experimental study of time-dependent variability phenomena in nanoscale circuits

À Romano Molar - 2023 - upcommons.upc.edu
Master's Thesis Page 1 Characterization setup for the experimental study of time dependent
variability phenomena in nanoscale circuits A Degree Thesis Submitted to the Faculty of the …