We review the state-of-the-art in the understanding of planar NAND Flash memory reliability
and discuss how the recent move to three-dimensional (3D) devices has affected this field …

NAND flash memory is ubiquitous in everyday life today because its capacity has
continuously increased and cost has continuously decreased over decades. This positive …

The huge amount of data produced in the 6G networks not only brings new challenges to the
reliability and efficiency of mobile devices but also drives rapid development of new storage …

NAND flash memory is a widely used storage medium that can be treated as a noisy
channel. Each flash memory cell stores data as the threshold voltage of a floating gate …

The NAND flash memory channel is corrupted by different types of noises, such as the data
retention noise and the wear-out noise, which lead to unknown channel offset and make the …

The multi-level-cell (MLC) NAND flash channel exhibits nonstationary behavior over
increasing program and erase (PE) cycles and data retention time. In this paper, an …

NAND flash memory is ubiquitous in everyday life today because its capacity has
continuously increased and cost has continuously decreased over decades. This positive …

Although data compression can benefit flash memory lifetime, little work has been done to
rigorously study the full potential of exploiting data compressibility to improve memory …

Metagenomics, the study of the genome sequences of diverse organisms in a common
environment, has led to significant advances in many fields. Since the species present in a …

The practical NAND flash memory suffers from various non-stationary noises that are difficult
to be predicted. For example, the data retention noise induced channel offset is unknown …