AI explainability and governance in smart energy systems: a review
Traditional electrical power grids have long suffered from operational unreliability, instability,
inflexibility, and inefficiency. Smart grids (or smart energy systems) continue to transform the …
inflexibility, and inefficiency. Smart grids (or smart energy systems) continue to transform the …
AI/ML algorithms and applications in VLSI design and technology
An evident challenge ahead for the integrated circuit (IC) industry is the investigation and
development of methods to reduce the design complexity ensuing from growing process …
development of methods to reduce the design complexity ensuing from growing process …
Reliability forecasting and Accelerated Lifetime Testing in advanced CMOS technologies
K Singh, S Kalra - Microelectronics Reliability, 2023 - Elsevier
This study harnesses a machine learning approach to precisely forecast the reliability of 22
nm Bulk Complementary Metal Oxide Transistor (CMOS) and 22 nm Metal Gate High-k …
nm Bulk Complementary Metal Oxide Transistor (CMOS) and 22 nm Metal Gate High-k …
Identifying good-dice-in-bad-neighborhoods using artificial neural networks
CH Yen, TR Wang, CM Liu, CH Yang… - IEEE Transactions …, 2024 - ieeexplore.ieee.org
It is known that the determination of the good-dice-in-bad-neighborhoods (GDBNs) has
been regarded as an effective technique to reduce the value of the defect parts per million …
been regarded as an effective technique to reduce the value of the defect parts per million …
CNN-based stochastic regression for IDDQ outlier identification
CH Yen, CT Chen, CY Wen, YY Chen… - … on Computer-Aided …, 2023 - ieeexplore.ieee.org
To reduce defect parts per million (DPPM) on IC products, IDDQ testing can be exploited for
identifying the outliers which are potentially defective but not detected by sign-off functional …
identifying the outliers which are potentially defective but not detected by sign-off functional …
A Multilabel Active Learning Framework for Microcontroller Performance Screening
In safety-critical applications, microcontrollers have to be tested to satisfy strict quality and
performance constraints. It has been demonstrated that on-chip ring oscillators can be used …
performance constraints. It has been demonstrated that on-chip ring oscillators can be used …
Knowledge-intensive diagnostics using case-based reasoning and synthetic case generation
S Pichette, C Thibeault - IEEE Transactions on Computer-Aided …, 2022 - ieeexplore.ieee.org
Due to commercial pressures, North-American printed circuit-board assembly manufacturers
have had to reposition themselves in the more difficult market segment of lower volume …
have had to reposition themselves in the more difficult market segment of lower volume …
Functional Testing of On-chip Analog/RF Circuits using Machine Learning based Regression Models
This study aims to utilize the simulation data col-lected during the design stages of analog
and RF Integrated Circuits (ICs), to enable faster functional testing during post-silicon …
and RF Integrated Circuits (ICs), to enable faster functional testing during post-silicon …
RTL Simulation Acceleration with Machine Learning Models
Simulation-based verification of register transfer level (RTL) designs is a time-consuming
process that can delay the time to market for new products. This work explores the use of …
process that can delay the time to market for new products. This work explores the use of …
A Qualitative Study That Explores the Implementation of Artificial Intelligence in Integrated Circuit Design
D Rittman - 2023 - search.proquest.com
The development of data processing technology relies heavily on integrated circuits (ICs),
which are electronic components that perform various tasks, including complex …
which are electronic components that perform various tasks, including complex …