For scanning hot electron microscopy experiments, n-Si/CaF 2/Au hot electron emitters were
designed and fabricated to characterize the emission properties. A self-consistent method …

抄録 We propose a new type of solid state electronic device with an operation principle
similar to the electron beam biprism in vacuum. This device can primarily be used for …

The scanning hot electron microscope (SHEM) is a tool to observe non-thermal-equilibrium
electrons under the surface of a solid, and it enables us to study the hot electron diffraction …

Scanning hot electron microscopy (SHEM) was introduced as a method of observing the
spatial distribution of hot electrons in solids. In this short note we estimate the spatial …

With the emitter/gap-potential/tip structure, we have studied the hot electron (HE)
transmission properties used in scanning hot electron microscopy (SHEM). The rational and …

In this article, we present simulation results for the solid-state biprism, a recently proposed
vertical ballistic electron wave interference device. The simulations are performed using a …

To observe the spatial distribution of subsurface hot electrons (HEs) with a scanning probe,
the relation between the spatial resolution and the hot electron current is investigated …

A versatile hot electron emitter of InGaAs/AlAs heterostructure with wide energy range at
high current density has been designed theoretically and fabricated experimentally. Such an …

Scanning hot electron microscopy (SHEM) is a method for observing the subsurface hot
electron (HE) distribution in a solid. SHEM requires that both the HE and thermal-equilibrium …

A new strategy to observe hot-electron interference/diffraction in solid employing a scanning
probe is presented. We use a ballistic electron emission microscopy (BEEM) configuration …