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Automatic control in microelectronics manufacturing: Practices, challenges, and possibilities
Advances in modeling and control will be required to meet future technical challenges in
microelectronics manufacturing. The implementation of closed-loop control on key unit …
microelectronics manufacturing. The implementation of closed-loop control on key unit …
[КНИГА][B] Handbook of industrial and systems engineering
AB Badiru - 2005 - books.google.com
Responding to the demand by researchers and practitioners for a comprehensive reference,
Handbook of Industrial and Systems Engineering offers full and easy access to a wide range …
Handbook of Industrial and Systems Engineering offers full and easy access to a wide range …
MPC-based process control of deep drawing: An industry 4.0 case study in automotive
Deep drawing is a metalworking procedure aimed at getting a cold metal sheet plastically
deformed in accordance with a pre-defined mould. Although this procedure is well …
deformed in accordance with a pre-defined mould. Although this procedure is well …
The effect of radio frequency plasma processing reactor circuitry on plasma characteristics
Past experiments have demonstrated that details of the external electrical circuitry can
strongly influence the performance of radio frequency (rf) plasma processing reactors …
strongly influence the performance of radio frequency (rf) plasma processing reactors …
Estimation and control in semiconductor etch: Practice and possibilities
Semiconductor wafer etching is, to a large extent, an open-loop process with little direct
feedback control. Most silicon chip manufacturers rely on the rigorous adherence to a …
feedback control. Most silicon chip manufacturers rely on the rigorous adherence to a …
Tuning of multivariable PI controllers by BLT method for TITO systems
The design of decentralized proportional integral (PI) controller based on biggest log
modulus tuning (BLT) tuning method is extended to design centralized PI controllers for two …
modulus tuning (BLT) tuning method is extended to design centralized PI controllers for two …
Integrated real-time and run-to-run control of etch depth in reactive ion etching
M Hankinson, T Vincent, KB Irani… - IEEE Transactions on …, 1997 - ieeexplore.ieee.org
Reactive Ion Etching (RIE) is a common process step in semiconductor manufacturing, yet
the underlying mechanisms remain poorly understood. Our goal is to reduce the variance of …
the underlying mechanisms remain poorly understood. Our goal is to reduce the variance of …
Run by run advanced process control of metal sputter deposition
Metal sputter deposition processes for semiconductor manufacturing are characterized by a
decrease in deposition rate from run to run as the sputter target degrades. The goal is to …
decrease in deposition rate from run to run as the sputter target degrades. The goal is to …
Monitoring and control of semiconductor manufacturing processes
S Limanond, J Si, K Tsakalis - IEEE Control Systems Magazine, 2002 - ieeexplore.ieee.org
Concerns optical measurement techniques for semiconductor manufacturing process
monitoring and control. They can provide previously impossible real-time monitoring of …
monitoring and control. They can provide previously impossible real-time monitoring of …
Virtual metrology for plasma etch processes.
S Lynn - 2011 - mural.maynoothuniversity.ie
Plasma processes can present dicult control challenges due to time-varying dynamics and a
lack of relevant and/or regular measurements. Virtual metrology (VM) is the use of …
lack of relevant and/or regular measurements. Virtual metrology (VM) is the use of …