Automatic control in microelectronics manufacturing: Practices, challenges, and possibilities

TF Edgar, SW Butler, WJ Campbell, C Pfeiffer, C Bode… - Automatica, 2000 - Elsevier
Advances in modeling and control will be required to meet future technical challenges in
microelectronics manufacturing. The implementation of closed-loop control on key unit …

[КНИГА][B] Handbook of industrial and systems engineering

AB Badiru - 2005 - books.google.com
Responding to the demand by researchers and practitioners for a comprehensive reference,
Handbook of Industrial and Systems Engineering offers full and easy access to a wide range …

MPC-based process control of deep drawing: An industry 4.0 case study in automotive

G Cavone, A Bozza, R Carli… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Deep drawing is a metalworking procedure aimed at getting a cold metal sheet plastically
deformed in accordance with a pre-defined mould. Although this procedure is well …

The effect of radio frequency plasma processing reactor circuitry on plasma characteristics

S Rauf, MJ Kushner - Journal of applied physics, 1998 - pubs.aip.org
Past experiments have demonstrated that details of the external electrical circuitry can
strongly influence the performance of radio frequency (rf) plasma processing reactors …

Estimation and control in semiconductor etch: Practice and possibilities

JV Ringwood, S Lynn, G Bacelli, B Ma… - IEEE Transactions …, 2009 - ieeexplore.ieee.org
Semiconductor wafer etching is, to a large extent, an open-loop process with little direct
feedback control. Most silicon chip manufacturers rely on the rigorous adherence to a …

Tuning of multivariable PI controllers by BLT method for TITO systems

CS Besta, M Chidambaram - Chemical engineering …, 2016 - Taylor & Francis
The design of decentralized proportional integral (PI) controller based on biggest log
modulus tuning (BLT) tuning method is extended to design centralized PI controllers for two …

Integrated real-time and run-to-run control of etch depth in reactive ion etching

M Hankinson, T Vincent, KB Irani… - IEEE Transactions on …, 1997 - ieeexplore.ieee.org
Reactive Ion Etching (RIE) is a common process step in semiconductor manufacturing, yet
the underlying mechanisms remain poorly understood. Our goal is to reduce the variance of …

Run by run advanced process control of metal sputter deposition

TH Smith, DS Boning, J Stefani… - IEEE Transactions on …, 1998 - ieeexplore.ieee.org
Metal sputter deposition processes for semiconductor manufacturing are characterized by a
decrease in deposition rate from run to run as the sputter target degrades. The goal is to …

Monitoring and control of semiconductor manufacturing processes

S Limanond, J Si, K Tsakalis - IEEE Control Systems Magazine, 2002 - ieeexplore.ieee.org
Concerns optical measurement techniques for semiconductor manufacturing process
monitoring and control. They can provide previously impossible real-time monitoring of …

Virtual metrology for plasma etch processes.

S Lynn - 2011 - mural.maynoothuniversity.ie
Plasma processes can present dicult control challenges due to time-varying dynamics and a
lack of relevant and/or regular measurements. Virtual metrology (VM) is the use of …