Development of surface reconstruction algorithms for optical interferometric measurement
D Wu, F Fang - Frontiers of Mechanical Engineering, 2021 - Springer
Optical interferometry is a powerful tool for measuring and characterizing areal surface
topography in precision manufacturing. A variety of instruments based on optical …
topography in precision manufacturing. A variety of instruments based on optical …
Coherence scanning interferometry
R Su - Advances in Optical Surface Texture Metrology, 2020 - iopscience.iop.org
Coherence scanning interferometry - Book chapter - IOPscience This site uses cookies. By
continuing to use this site you agree to our use of cookies. To find out more, see our Privacy …
continuing to use this site you agree to our use of cookies. To find out more, see our Privacy …
Scanning error detection and compensation algorithm for white-light interferometry
K Cui, Q Liu, X Huang, H Zhang, L Li - Optics and Lasers in Engineering, 2022 - Elsevier
As the primary error source in white-light interferometry (WLI), the error of scanning steps
directly affects coherence peak sensing and greatly lowers the measurement accuracy …
directly affects coherence peak sensing and greatly lowers the measurement accuracy …
Inkjet‐Printed Ternary Oxide Dielectric and Doped Interface Layer for Metal‐Oxide Thin‐Film Transistors with Low Voltage Operation
Additive solution process patterning, such as inkjet printing, is desirable for high‐throughput
roll‐to‐roll and sheet fabrication environments of electronics manufacturing because it can …
roll‐to‐roll and sheet fabrication environments of electronics manufacturing because it can …
[PDF][PDF] Fast Fourier Transform detection and reduction of high-frequency errors from the results of surface topography profile measurements of honed textures
P Podulka - Eksploatacja i Niezawodność, 2021 - bibliotekanauki.pl
In this paper, various type of noise detection procedures with surface topography profile
analysis were proposed, compared (studied) and suggested. The honed cylinder liner …
analysis were proposed, compared (studied) and suggested. The honed cylinder liner …
Accurate measurements of droplet volume with coherence scanning interferometry
Z Zhang, J Chen, H Yang, Z Yin - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Accurate volume measurement of droplets in inkjet printed organic light-emitting diode
(OLED) is important to achieve defect-free manufacturing. Although coherence scanning …
(OLED) is important to achieve defect-free manufacturing. Although coherence scanning …
Research on the quality control technology of micro-topography machining based on in situ white light interferometry
White light interferometry (WLI) is a fast nanoscale surface measurement method suitable for
measuring the quality of machined surfaces. In this study, a miniaturized WLI integrated into …
measuring the quality of machined surfaces. In this study, a miniaturized WLI integrated into …
A white-light interferometry method for 3D measurement of compactly spaced micro-nano structural units
L **n, Z Yang, Z Liu - Optics & Laser Technology, 2024 - Elsevier
Micro-nanostructures refer to technologies that operate at the nanoscale and provide
materials and devices with unique mechanical, physical, and chemical properties. These …
materials and devices with unique mechanical, physical, and chemical properties. These …
Valley-positioning-assisted discrete cross-correlation algorithm for fast cavity length interrogation of fiber-optic Fabry–Perot sensors
J Kang, H Chen, X Zhang, J Zhang, Z Guo, W Wang - Measurement, 2022 - Elsevier
This study proposes a valley-positioning-assisted discrete cross-correlation algorithm for the
fast cavity length interrogation of fiber-optic Fabry–Perot (FP) sensors. Because the number …
fast cavity length interrogation of fiber-optic Fabry–Perot (FP) sensors. Because the number …
Application of clustering filter for noise and outlier suppression in optical measurement of structured surfaces
In comparison to tactile sensors, optical techniques can provide a fast, nondestructive
profile/areal surface measurement solution. Nonetheless, high measurement noise …
profile/areal surface measurement solution. Nonetheless, high measurement noise …