Development of surface reconstruction algorithms for optical interferometric measurement

D Wu, F Fang - Frontiers of Mechanical Engineering, 2021 - Springer
Optical interferometry is a powerful tool for measuring and characterizing areal surface
topography in precision manufacturing. A variety of instruments based on optical …

Coherence scanning interferometry

R Su - Advances in Optical Surface Texture Metrology, 2020 - iopscience.iop.org
Coherence scanning interferometry - Book chapter - IOPscience This site uses cookies. By
continuing to use this site you agree to our use of cookies. To find out more, see our Privacy …

Scanning error detection and compensation algorithm for white-light interferometry

K Cui, Q Liu, X Huang, H Zhang, L Li - Optics and Lasers in Engineering, 2022 - Elsevier
As the primary error source in white-light interferometry (WLI), the error of scanning steps
directly affects coherence peak sensing and greatly lowers the measurement accuracy …

Inkjet‐Printed Ternary Oxide Dielectric and Doped Interface Layer for Metal‐Oxide Thin‐Film Transistors with Low Voltage Operation

L Gillan, S Li, J Lahtinen, CH Chang… - Advanced Materials …, 2021 - Wiley Online Library
Additive solution process patterning, such as inkjet printing, is desirable for high‐throughput
roll‐to‐roll and sheet fabrication environments of electronics manufacturing because it can …

[PDF][PDF] Fast Fourier Transform detection and reduction of high-frequency errors from the results of surface topography profile measurements of honed textures

P Podulka - Eksploatacja i Niezawodność, 2021 - bibliotekanauki.pl
In this paper, various type of noise detection procedures with surface topography profile
analysis were proposed, compared (studied) and suggested. The honed cylinder liner …

Accurate measurements of droplet volume with coherence scanning interferometry

Z Zhang, J Chen, H Yang, Z Yin - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Accurate volume measurement of droplets in inkjet printed organic light-emitting diode
(OLED) is important to achieve defect-free manufacturing. Although coherence scanning …

Research on the quality control technology of micro-topography machining based on in situ white light interferometry

X Wu, L Zhu, F Fang, X Zhang - Measurement, 2023 - Elsevier
White light interferometry (WLI) is a fast nanoscale surface measurement method suitable for
measuring the quality of machined surfaces. In this study, a miniaturized WLI integrated into …

A white-light interferometry method for 3D measurement of compactly spaced micro-nano structural units

L **n, Z Yang, Z Liu - Optics & Laser Technology, 2024 - Elsevier
Micro-nanostructures refer to technologies that operate at the nanoscale and provide
materials and devices with unique mechanical, physical, and chemical properties. These …

Valley-positioning-assisted discrete cross-correlation algorithm for fast cavity length interrogation of fiber-optic Fabry–Perot sensors

J Kang, H Chen, X Zhang, J Zhang, Z Guo, W Wang - Measurement, 2022 - Elsevier
This study proposes a valley-positioning-assisted discrete cross-correlation algorithm for the
fast cavity length interrogation of fiber-optic Fabry–Perot (FP) sensors. Because the number …

Application of clustering filter for noise and outlier suppression in optical measurement of structured surfaces

S Lou, D Tang, W Zeng, T Zhang, F Gao… - IEEE Transactions …, 2020 - ieeexplore.ieee.org
In comparison to tactile sensors, optical techniques can provide a fast, nondestructive
profile/areal surface measurement solution. Nonetheless, high measurement noise …