The aim of this review paper is to describe in a comprehensive manner the current
understanding of the radiation response of state-of-the-art Silicon-on-Insulator (SOI) and …

An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …

This paper investigates the impact of terrestrial radiation on soft error (SE) sensitivity along
the very large-scale integration (VLSI) roadmap of bulk, FDSOI and finFET nano-scale …

The ability for Single Event Transients (SETs) to induce soft errors in Integrated Circuits (ICs)
was predicted for the first time by Wallmark and Marcus in the early 60's and was confirmed …

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering
sciences. Soft errors are by nature multiscale and multiphysics problems that combine not …

There is an invisible enemy that constantly threatens the operation of electronics: ionizing
radiation. From sea level to outer space, ionizing radiation is virtually everywhere. At sea …

MRED is a Python-language scriptable computer application that simulates radiation
transport. It is the computational engine for the on-line tool CRÈME-MC. MRED is based on …

Several improvements are added to the MicroElec extension of Geant4 in order to track very
low energy electrons, protons and ions in different materials. The interaction processes for …

A set of upset criteria based on circuit characteristic switching time frame is developed and
used to bridge transistor-level TCAD simulations to circuit-level single-event (SE) upset …

We present experimental evidence of single-event upsets in 28 and 45 nm CMOS SRAMs
produced by single energetic electrons. Upsets are observed within 10% of nominal supply …