[HTML][HTML] Atomic layer deposition of silicon-based dielectrics for semiconductor manufacturing: Current status and future outlook

RA Ovanesyan, EA Filatova, SD Elliott… - Journal of Vacuum …, 2019 - pubs.aip.org
The fabrication of next-generation semiconductor devices has created a need for low-
temperature (≤ 400 C) deposition of highly-conformal (> 95%) SiO 2, SiN x, and SiC films …

A scalable universal Ising machine based on interaction-centric storage and compute-in-memory

W Yue, T Zhang, Z **g, K Wu, Y Yang, Z Yang… - Nature …, 2024 - nature.com
Ising machines are annealing processors that can solve combinatorial optimization
problems via the physical evolution of the corresponding Ising graphs. Such machines are …

High performance graph convolutional networks with applications in testability analysis

Y Ma, H Ren, B Khailany, H Sikka, L Luo… - Proceedings of the 56th …, 2019 - dl.acm.org
Applications of deep learning to electronic design automation (EDA) have recently begun to
emerge, although they have mainly been limited to processing of regular structured data …

Design for manufacturability and reliability in extreme-scaling VLSI

B Yu, X Xu, S Roy, Y Lin, J Ou, DZ Pan - Science China Information …, 2016 - Springer
In the last five decades, the number of transistors on a chip has increased exponentially in
accordance with the Moore's law, and the semiconductor industry has followed this law as …

Layout decomposition for triple patterning lithography

B Yu, K Yuan, D Ding, DZ Pan - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
As minimum feature size and pitch spacing further scale down, triple patterning lithography
is a likely 193 nm extension along the paradigm of double patterning lithography for 14-nm …

Understanding graphs in EDA: From shallow to deep learning

Y Ma, Z He, W Li, L Zhang, B Yu - Proceedings of the 2020 international …, 2020 - dl.acm.org
As the scale of integrated circuits keeps increasing, it is witnessed that there is a surge in the
research of electronic design automation (EDA) to make the technology node scaling …

Design for manufacturing with emerging nanolithography

DZ Pan, B Yu, JR Gao - … Aided Design of Integrated Circuits and …, 2013 - ieeexplore.ieee.org
In this paper, we survey key design for manufacturing issues for extreme scaling with
emerging nanolithography technologies, including double/multiple patterning lithography …

A novel layout decomposition algorithm for triple patterning lithography

SY Fang, YW Chang, WY Chen - Proceedings of the 49th Annual Design …, 2012 - dl.acm.org
While double patterning lithography (DPL) has been widely recognized as one of the most
promising solutions for the sub-22nm technology node to enhance pattern printability, triple …

A unified framework for simultaneous layout decomposition and mask optimization

Y Ma, W Zhong, S Hu, JR Gao, J Kuang… - … on Computer-Aided …, 2020 - ieeexplore.ieee.org
In advanced technology nodes, layout decomposition (LD) and mask optimization (MO) are
two key stages in integrated circuit design. Due to the inconsistency of the objectives of …

Multi-patterning lithography aware cell placement in integrated circuit design

KB Agarwal, CJ Alpert, Z Li, GJ Nam… - US Patent …, 2013 - Google Patents
TB. Chiou et al.,“Development of layout split algorithms and printability evaluation for double
patterning technology.” Proceed ings of the SPIE, vol. 6924, 2008, pp. 69243M-1-69243M …