Symmetric BSIM-SOI—Part I: A compact model for dynamically depleted SOI MOSFETs
In this article, we present a symmetric surface-potential-based model for dynamic depletion
(DD) device operation of silicon-on-insulator (SOI) FETs for RF and analog IC design …
(DD) device operation of silicon-on-insulator (SOI) FETs for RF and analog IC design …
A low‐power native NMOS‐based bandgap reference operating from 55°C to 125°C with Li‐Ion battery compatibility
The paper describes the implementation of a bandgap reference based on native‐MOSFET
transistors for low‐power sensor node applications. The circuit can operate from− 55° C to …
transistors for low‐power sensor node applications. The circuit can operate from− 55° C to …
Charge-based modeling of transition metal dichalcogenide transistors including ambipolar, trap**, and negative capacitance effects
In this paper, we present a charge-based compact model for transition metal dichalcogenide
(TMD)-based thin-channel field-effect transistor. In model development, first, charge …
(TMD)-based thin-channel field-effect transistor. In model development, first, charge …
Optimized mathematical model of experimental characteristics of 14 nm TG N FinFET
A Lazzaz, K Bousbahi, M Ghamnia - Micro and Nanostructures, 2022 - Elsevier
Quantum effects play a dominant role in nanometric structures for which we need to use new
methods to describe this phenomenon in device characterizations. In this paper an …
methods to describe this phenomenon in device characterizations. In this paper an …
Symmetric BSIM-SOI—Part II: A Compact Model for Partially Depleted SOI MOSFETs
In this part, we present a new charge-based symmetric compact model of partially depleted
silicon-on-insulator (PDSOI) technology. The model's core charge calculations are based on …
silicon-on-insulator (PDSOI) technology. The model's core charge calculations are based on …
Technique for Iterative Refinement of Parameter Values in Analytical Models of Microelectronic Devices
AS Sinyukin, AV Kovalev - Russian Microelectronics, 2023 - Springer
The physical models of MOS transistors used in the design of modern integrated circuits are
accurate, which makes it possible to simulate their operation with the given degree of …
accurate, which makes it possible to simulate their operation with the given degree of …
Quantum systems engineering
K Bjergstrom - 2020 - repository.lboro.ac.uk
With the aim of defining a Quantum Systems Engineering paradigm, we show that the
systems engineering of quantum technologies is materially different from systems …
systems engineering of quantum technologies is materially different from systems …
[HTML][HTML] МЕТОДИКА ИТЕРАЦИОННОГО УТОЧНЕНИЯ ЗНАЧЕНИЙ ПАРАМЕТРОВ В АНАЛИТИЧЕСКИХ МОДЕЛЯХ МИКРОЭЛЕКТРОННЫХ УСТРОЙСТВ
АС Синюкин, АВ Ковалев - Известия высших учебных заведений …, 2022 - cyberleninka.ru
Физические модели МОП-транзисторов, применяемые при проектировании
современных интегральных микросхем, характеризуются точностью, что позволяет с …
современных интегральных микросхем, характеризуются точностью, что позволяет с …
Учредители: Национальный исследовательский университет" Московский институт электронной техники
АС СИНЮКИН, АВ КОВАЛЕВ - ИЗВЕСТИЯ ВЫСШИХ УЧЕБНЫХ …, 2022 - elibrary.ru
Физические модели МОП-транзисторов, применяемые при проектировании
современных интегральных микросхем, характеризуются точностью, что позволяет с …
современных интегральных микросхем, характеризуются точностью, что позволяет с …