Pull-in instability as an inherently nonlinear and crucial effect continues to become
increasingly important for the design of electrostatic MEMS and NEMS devices and ever …

This paper reviews the state of the art knowledge related to critical failure mechanisms in
electrostatic micro-and nano-electromechanical systems (MEMS and NEMS) which are the …

This article deals with the analysis of the relationship between the pull-off force measured by
atomic force microscopy and the dimensions of water bridge condensed between a …

In this work, interaction forces between two silica nanospheres after contact, including the
van der Waals (vdW) attraction, Born repulsion, and mechanical contact forces are studied …

The temperature dependence of the capillary forces at nano-sized contacts is investigated.
Two different resistive scanning thermal microscopy (SThM) nanoprobes are used in this …

Microelectromechanical systems (MEMS) switches are attractive for many applications
including radio frequency and microwave systems, logic devices, acceleration sensing and …

Nanobubbles are believed to have surface charges at the gas–liquid interface. However, the
effect of various factors on the formation mechanism and stability of these charged species is …

A systematic experimental and theoretical evaluation of stiction between intermittently
contacting silicon surfaces in an ultra-clean encapsulation process is presented, evaluating …

Charges injection and accumulation in the dielectric remains a critical issue, mainly because
these phenomena are involved in a great number of failure mechanisms in cables or …

In this study, two different characterization techniques based on Kelvin probe force
microscopy (KPFM) have been used to investigate the dielectric and substrate charging in …