A survey on metric learning for feature vectors and structured data

A Bellet, A Habrard, M Sebban - arxiv preprint arxiv:1306.6709, 2013 - arxiv.org
The need for appropriate ways to measure the distance or similarity between data is
ubiquitous in machine learning, pattern recognition and data mining, but handcrafting such …

Facial kinship verification: A comprehensive review and outlook

X Wu, X Feng, X Cao, X Xu, D Hu, MB López… - International Journal of …, 2022 - Springer
Abstract The goal of Facial Kinship Verification (FKV) is to automatically determine whether
two individuals have a kin relationship or not from their given facial images or videos. It is an …

Discriminative deep metric learning for face and kinship verification

J Lu, J Hu, YP Tan - IEEE Transactions on Image Processing, 2017 - ieeexplore.ieee.org
This paper presents a new discriminative deep metric learning (DDML) method for face and
kinship verification in wild conditions. While metric learning has achieved reasonably good …

Deep transfer metric learning

J Hu, J Lu, YP Tan - Proceedings of the IEEE conference on …, 2015 - cv-foundation.org
Conventional metric learning methods usually assume that the training and test samples are
captured in similar scenarios so that their distributions are assumed to be the same. This …

Sharable and individual multi-view metric learning

J Hu, J Lu, YP Tan - IEEE transactions on pattern analysis and …, 2017 - ieeexplore.ieee.org
This paper presents a sharable and individual multi-view metric learning (MvML) approach
for visual recognition. Unlike conventional metric leaning methods which learn a distance …

Discriminative multimetric learning for kinship verification

H Yan, J Lu, W Deng, X Zhou - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
In this paper, we propose a new discriminative multimetric learning method for kinship
verification via facial image analysis. Given each face image, we first extract multiple …

Robust transfer metric learning for image classification

Z Ding, Y Fu - IEEE Transactions on Image Processing, 2016 - ieeexplore.ieee.org
Metric learning has attracted increasing attention due to its critical role in image analysis and
classification. Conventional metric learning always assumes that the training and test data …

Clustering by fast search and find of density peaks via heat diffusion

R Mehmood, G Zhang, R Bie, H Dawood, H Ahmad - Neurocomputing, 2016 - Elsevier
Clustering by fast search and find of density peaks (CFSFDP) is a novel algorithm that
efficiently discovers the centers of clusters by finding the density peaks. The accuracy of …

High-order knowledge-based discriminant features for kinship verification

M Khammari, A Chouchane, A Ouamane… - Pattern Recognition …, 2023 - Elsevier
This research work aims to propose an effective and robust face kinship verification system
by leveraging several axes, including advanced learning techniques, deep learning, and …

Low resolution face recognition across variations in pose and illumination

SP Mudunuri, S Biswas - IEEE transactions on pattern analysis …, 2015 - ieeexplore.ieee.org
We propose a completely automatic approach for recognizing low resolution face images
captured in uncontrolled environment. The approach uses multidimensional scaling to learn …