Spinel ferrites for resistive random access memory applications

K Gayakvad, K Somdatta, V Mathe, T Dongale… - Emergent …, 2024 - Springer
Cutting edge science and technology needs high quality data storage devices for their
applications in artificial intelligence and digital industries. Resistive random access memory …

Structural and electrical response of emerging memories exposed to heavy ion radiation

T Vogel, A Zintler, N Kaiser, N Guillaume, G Lefèvre… - ACS …, 2022 - ACS Publications
Hafnium oxide-and GeSbTe-based functional layers are promising candidates in material
systems for emerging memory technologies. They are also discussed as contenders for …

[HTML][HTML] Transition Metal Oxide Based Resistive Random-Access Memory: An Overview of Materials and Device Performance Enhancement Techniques

D Yadav, AK Dwivedi, S Verma, DK Avasthi - Journal of Science: Advanced …, 2024 - Elsevier
The emergence of the big data era has led to enormous demand for memory devices that
are low cost, flexible, fabrication friendly, transparent, energy efficient, and have a higher …

Effects of Bottom Electrode Materials on the Resistive Switching Characteristics of HfO2-Based RRAM Devices

N Arun, SVS Nageswara Rao, AP Pathak - Journal of Electronic Materials, 2023 - Springer
In this paper, we present the results of our systematic investigations of the resistive switching
characteristics of HfO2-based metal–insulator–metal structures using four different metal …

Radiation Response of HfOx-Based Resistive Random Access Memory (RRAM) Devices

A Nimmala, AP Pathak… - ACS Applied …, 2022 - ACS Publications
A report on the fabrication and radiation response of HfO x thin film-based resistive random
access memory (RRAM) devices is presented in this study. Au/HfO x/Au cross-bar (10 μm× …

Resistive switching properties of hafnium oxide thin-films sputtered at different oxygen partial pressures

N Arun, MM Neethish, VV Ravi Kanth Kumar… - Journal of Materials …, 2024 - Springer
We report a study on the effects of O2/Ar ratio on the resistive switching properties of HfO x
thin-films deposited by using RF magnetron sputtering. Ar is kept at a constant flow rate of 30 …

A study on the gamma and swift heavy ion irradiation-induced effects on the electrical properties of TaOx-based MOS capacitors

RSP Goud, M Akkanaboina, S Machiboyina… - Nuclear Instruments and …, 2024 - Elsevier
In this work, we present a detailed study on the effects of energetic ions and gamma
irradiation on the performance of non-stoichiometric tantalum oxide (TaO x) based Metal …

[HTML][HTML] Heavy ion irradiation induced phase transitions and their impact on the switching behavior of ferroelectric hafnia

M Lederer, T Vogel, T Kämpfe, N Kaiser… - Journal of Applied …, 2022 - pubs.aip.org
The discovery of ferroelectric hafnium oxide enabled a variety of non-volatile memory
devices, like ferroelectric tunnel junctions or field-effect transistors. Reliable application of …

Laser annealing of Au/HfO2 bi-layers to fabricate Au nanoparticles without altering the phase of HfO2 for applications in SERS and memory devices

KV Kumar, JP Goud, KR Kumar, KCJ Raju… - Journal of Materials …, 2022 - Springer
We report an athermal laser annealing technique to fabricate a high-density array of gold
nanoparticles on the surface of hafnium oxide thin films without altering the phase of HfO2 …

Design and development of MoS2 based low-power random-access memory devices

N Arun, S Kapoor, JP Singh - Materials Science in Semiconductor …, 2025 - Elsevier
Abstract 2D material has a great attraction towards memory device fabrication for their
greater potential application in low power and fast switching nature. Molybdenum disulfide …