Luminescent erbium‐doped silicon thin films for advanced anti‐counterfeit labels

AO Larin, LN Dvoretckaia, AM Mozharov… - Advanced …, 2021 - Wiley Online Library
The never‐ending struggle against counterfeit demands the constant development of
security labels and their fabrication methods. This study demonstrates a novel type of …

Si based optoelectronics for communications

G Masini, L Colace, G Assanto - Materials Science and Engineering: B, 2002 - Elsevier
Si based optoelectronic devices have recently successfully entered the market of optical
communications. This fact is stimulating renewed efforts in the design of optoelectronic …

Electroluminescence of erbium–oxygen‐doped silicon diodes grown by molecular beam epitaxy

J Stimmer, A Reittinger, JF Nützel, G Abstreiter… - Applied physics …, 1996 - pubs.aip.org
We have fabricated erbium–oxygen‐doped silicon light emitting diodes with molecular beam
epitaxy by simultaneously evaporating erbium and silicon and providing a suitable …

Effect of O: Er concentration ratio on the structural, electrical, and optical properties of Si: Er: O layers grown by molecular beam epitaxy

S Scalese, G Franzo, S Mirabella, M Re… - Journal of Applied …, 2000 - pubs.aip.org
The structural, electrical, and optical properties of crystalline Si codoped with Er and O by
molecular beam epitaxy (MBE) have been investigated in detail. Si: Er: O layers (∼ 250 nm …

Erbium in silicon

J Michel, LVC Assali, MT Morse… - Semiconductors and …, 1997 - Elsevier
Publisher Summary This chapter describes erbium (Er) in silicon (Si). Silicon is the
dominating material in semiconductor manufacturing. Ninety-five percent of all …

An alternative experimental approach to produce rare-earth-doped SiOx films

AR Zanatta - Journal of Applied Physics, 2016 - pubs.aip.org
Rare-earth (RE) doped silicon-oxide (SiO x) films were prepared by sputtering a combined
Si+ RE 2 O 3 target with argon ions. The study comprised the neodymium (Nd) and …

Growth of Er‐doped silicon using metalorganics by plasma‐enhanced chemical vapor deposition

PS Andry, WJ Varhue, F Ladipo, K Ahmed… - Journal of applied …, 1996 - pubs.aip.org
Epitaxial growth of Er‐doped silicon films has been performed by plasma‐enhanced
chemical vapor deposition at low temperature (430° C) using an electron cyclotron …

Effects of hydrogen plasma treatment on the 1.54 μm luminescence of erbium-doped porous silicon

T Dejima, R Saito, S Yugo, H Isshiki… - Journal of applied …, 1998 - pubs.aip.org
Well resolved, sharp photoluminescence (PL) peaks of Er 3+(4f 11) ions at∼ 1.54 μm are
obtained from Er-doped porous silicon (PS: Er) on which a hydrogen plasma treatment is …

Photoluminescence of a-Si:H films grown by plasma-enhanced chemical vapor deposition and doped with erbium from the metallorganic compound Er(HFA)3·DME

VB Voronkov, VG Golubev, AV Medvedev… - Physics of the Solid …, 1998 - Springer
Abstract Using standard low-temperature (< 300° C) plasma-enhanced chemical vapor
deposition (PE CVD) technology, films of a Si (Er): H were obtained that emitted light in the …

Редкоземельные элементы в монокристаллическом кремнии

Приведен обзор поведения примесей редкоземельных элементов в
монокристалическом кремнии. Описаны процессы, протекающие при ионном …