Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
In situ epitaxial thickening of wafer-scale, highly oriented nanotwinned Ag on tailored polycrystalline Cu substrates
X Zhan, Z Zhu - Acta Materialia, 2024 - Elsevier
Abstract Highly (111)-oriented nanotwinned Ag (nt-Ag) is a promising candidate for a next-
generation direct metal bonding material without a vacuum environment. However …
generation direct metal bonding material without a vacuum environment. However …
Stored energy density solution for TSV-Cu structure deformation under thermal cyclic loading based on PINN
H Qian, J Shen, Z Huang, J Wang, Q Zhu… - International Journal of …, 2024 - Elsevier
TSV-Cu is widely used for chip interconnects, where high testing costs and complex crystal
plasticity finite element (CPFE) limit the research of its deep microplastic evolution process …
plasticity finite element (CPFE) limit the research of its deep microplastic evolution process …
Fatigue behaviour analysis of thermal cyclic loading for through-silicon via structures based on backstress stored energy density
H Qian, Z Huang, H Fan, Y Wang, L Cao, Q Zhu… - International Journal of …, 2024 - Elsevier
Through-silicon via (TSV) structures are widely used in microelectronic due to the ease of
chip interconnection. Few research has focused on investigating the fatigue properties of …
chip interconnection. Few research has focused on investigating the fatigue properties of …
Cu–Cu direct bonding in air by in-situ reduction of copper oxide with glycerol
X Wang, S Han, F ** miniaturized and high-performance microwave modules. Herein …