Secondary ion mass spectrometry
Secondary ion mass spectrometry (SIMS) is a technique for chemical analysis and imaging
of solid materials, with applications in many areas of science and technology. It involves …
of solid materials, with applications in many areas of science and technology. It involves …
Gently does it!: in situ preparation of alkali metal–solid electrolyte interfaces for photoelectron spectroscopy
The key charge transfer processes in electrochemical energy storage devices occur at
electrode–electrolyte interfaces, which are typically buried, making it challenging to access …
electrode–electrolyte interfaces, which are typically buried, making it challenging to access …
Measuring compositions in organic depth profiling: results from a VAMAS interlaboratory study
We report the results of a VAMAS (Versailles Project on Advanced Materials and Standards)
interlaboratory study on the measurement of composition in organic depth profiling. Layered …
interlaboratory study on the measurement of composition in organic depth profiling. Layered …
Back to the basics of time-of-flight secondary ion mass spectrometry of bio-related samples. I. Instrumentation and data collection
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used widely throughout
industrial and academic research due to the high information content of the chemically …
industrial and academic research due to the high information content of the chemically …
Ion yield enhancement at the organic/inorganic interface in SIMS analysis using Ar-GCIB
V Cristaudo, C Poleunis, P Laha, P Eloy… - Applied Surface …, 2021 - Elsevier
Argon gas cluster ion beams (Ar-GCIBs) provide new opportunities for molecular depth
profiling and imaging of organic materials and biological samples, thanks to recent …
profiling and imaging of organic materials and biological samples, thanks to recent …
Practical guides for x-ray photoelectron spectroscopy: Use of argon ion beams for sputter depth profiling and cleaning
Ion beams are used in x-ray photoelectron spectroscopy (XPS) to clean samples and
perform compositional sputter depth profiles. The purpose of this article is to compile good …
perform compositional sputter depth profiles. The purpose of this article is to compile good …
Semiempirical rules to determine drug sensitivity and ionization efficiency in secondary ion mass spectrometry using a model tissue sample
There is an increasing need in the pharmaceutical industry to reduce drug failure at late
stage and thus reduce the cost of develo** a new medicine. Since most drug targets are …
stage and thus reduce the cost of develo** a new medicine. Since most drug targets are …
Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size
An analysis is presented of the effect of experimental parameters such as energy, angle and
cluster size on the depth resolution in depth profiling organic materials using Ar gas cluster …
cluster size on the depth resolution in depth profiling organic materials using Ar gas cluster …
Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry to Depth Profile Nanoparticles in Polymer Nanocomposites
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a versatile surface-sensitive
technique for characterizing both hard and soft matter. Its chemical and molecular specificity …
technique for characterizing both hard and soft matter. Its chemical and molecular specificity …
Sorption of Fulvic Acids onto Titanium Dioxide Nanoparticles Extracted from Commercial Sunscreens: ToF-SIMS and High-Dimensional Data Analysis
N Tayyebi Sabet Khomami, A Welle, S Kunz, A Philippe - Coatings, 2022 - mdpi.com
Titanium dioxide nanoparticles (n-TiO2) are common ingredients of sunscreens and are
often released into surface waters during usage. Once released, the surface chemistry of n …
often released into surface waters during usage. Once released, the surface chemistry of n …