Simulation study of an ultralow switching loss p-GaN gate HEMT with dynamic charge storage mechanism

F Wang, W Chen, X Xu, R Sun, Z Wang… - … on Electron Devices, 2020 - ieeexplore.ieee.org
In this article, a dynamic charge storage mechanism is proposed for designing the p-GaN
gate dynamic charge storage high-electron-mobility transistor (DCS-HEMT) with ultralow …

Two-dimensional polarization do** of GaN heterojunction and its potential for realizing lateral pn junction devices

Z Wang, L Li - Applied Physics A, 2022 - Springer
In the gallium nitride (GaN) commercial applications such as high-power illumination and
portable charging station, bipolar devices are highly demanded because of their superior …

An analytical model on the gate control capability in p-GaN Gate AlGaN/GaN high-electron-mobility transistors considering buffer acceptor traps

F Wang, W Chen, R Sun, Z Wang… - Journal of Physics D …, 2020 - iopscience.iop.org
An analytical model considering the buffer acceptor traps is presented in this paper to study
the gate control capability in p-GaN gate AlGaN/GaN high-electron-mobility transistors …

Review on Main Gate Characteristics of P-Type GaN Gate High-Electron-Mobility Transistors

Z Wang, J Nan, Z Tian, P Liu, Y Wu, J Zhang - Micromachines, 2023 - mdpi.com
As wide bandgap semiconductors, gallium nitride (GaN) lateral high-electron-mobility
transistors (HEMTs) possess high breakdown voltage, low resistance and high frequency …

An AlGaN/GaN HEMT with sputter-SiN passivation for the on-state performance improvement

C Yu, G Ding, Q Feng, X Wang, H Yang, W Xu… - Micro and …, 2022 - Elsevier
Abstract An AlGaN/GaN high electron mobility transistor (HEMT) using the magnetron
sputter to deposit silicon nitride (SiN) passivation layer is proposed in this paper. The AlGaN …

Impact of composition and thickness of step-graded AlGaN barrier in AlGaN/GaN heterostructures

H Liu, H Huang, K Wang, Z **e, H Wang - Materials Science in …, 2024 - Elsevier
We propose an optimization method to change the Al component and the thickness of step-
graded AlGaN barrier to achieve better electrical performance of the device. Based on the …

High voltage normally-off p-GaN gate HEMT with the compatible high threshold and drain current

C Yu, F Wang, J He, Y Zhang, R Sun… - ECS Journal of Solid …, 2022 - iopscience.iop.org
In this paper, we demonstrate a high voltage normally-off p-GaN gate high-electron-mobility-
transistor (HEMT) to realize the compatible high threshold voltage (V TH) and high drain …

Interplay Between γ–Ray Irradiation and 3DEG for Dosimeter Applications

K Sehra, V Kumari, P Kasturi, M Gupta, M Mishra… - IEEE …, 2022 - ieeexplore.ieee.org
This work investigates the cumulative dose 60 Co gamma ()–ray irradiation effects on
enhancement mode HEMT devices inheriting 3D–Electron and Hole Gases for dosimeter …

Simulation study of a high gate-to-source ESD robustness power p-GaN HEMT with self-triggered discharging channel

Y **n, W Chen, R Sun, F Wang, X Deng… - … on Electron Devices, 2021 - ieeexplore.ieee.org
This article proposes a novel power p-GaN high-electron-mobility transistor (HEMT) with self-
triggered discharging channel to improve gate-to-source electrostatic discharge (ESD) …